Numerical Interpretation of Reflectance/Transmittance Difference Spectroscopy of an-isotropic Multi-layer Thin Film

D.T. Kwok; P.K.  Chu

Numerical Interpretation of Reflectance/Transmittance Difference Spectroscopy of an-isotropic Multi-layer Thin Film

Research output: Conference Papers › RGC 32 - Refereed conference paper (without host publication) › peer-review

Original language	English
Publication status	Published - Apr 2000
Event	International Conference on Metallurgical Coatings and Thin Films (ICMCTF 2000) - Town and Country Hotel, San Diego, United States Duration: 10 Apr 2000 → 14 Apr 2000

Conference

Conference	International Conference on Metallurgical Coatings and Thin Films (ICMCTF 2000)
Place	United States
City	San Diego
Period	10/04/00 → 14/04/00

Bibliographical note

Research Unit(s) information for this publication is provided by the author(s) concerned.

Other Access Options

Check CityUHK Library

Permanent Link

Right click to copy link

Cite this

@conference{48500f1d1c654e0bb384d98bf7dde445,

title = "Numerical Interpretation of Reflectance/Transmittance Difference Spectroscopy of an-isotropic Multi-layer Thin Film",

author = "D.T. Kwok and P.K. Chu",

note = "Research Unit(s) information for this publication is provided by the author(s) concerned.; International Conference on Metallurgical Coatings and Thin Films (ICMCTF 2000)<br/> ; Conference date: 10-04-2000 Through 14-04-2000",

year = "2000",

month = apr,

language = "English",

}

Numerical Interpretation of Reflectance/Transmittance Difference Spectroscopy of an-isotropic Multi-layer Thin Film. / Kwok, D.T.; Chu, P.K. .
2000. Paper presented at International Conference on Metallurgical Coatings and Thin Films (ICMCTF 2000)
, San Diego, California, United States.

Research output: Conference Papers › RGC 32 - Refereed conference paper (without host publication) › peer-review

TY - CONF

T1 - Numerical Interpretation of Reflectance/Transmittance Difference Spectroscopy of an-isotropic Multi-layer Thin Film

AU - Kwok, D.T.

AU - Chu, P.K.

N1 - Research Unit(s) information for this publication is provided by the author(s) concerned.

PY - 2000/4

Y1 - 2000/4

M3 - RGC 32 - Refereed conference paper (without host publication)

T2 - International Conference on Metallurgical Coatings and Thin Films (ICMCTF 2000)<br/>

Y2 - 10 April 2000 through 14 April 2000

ER -