Nucleation and growth of diamond films on aluminum nitride by hot filament chemical vapor deposition

W. L. Wang, R. Q. Zhang, K. J. Liao, Y. W. Sun, B. B. Wang

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    24 Citations (Scopus)

    Abstract

    Nucleation and growth of diamond films on aluminum nitride (ALN) coatings were investigated by scanning electron microscopy, Raman spectroscopy and scratch test. ALN films were grown in a magnetron sputtering deposition. The substrates were Si(111) and tungsten carbide (WC). Chemical vapor deposition (CVD) diamond films were deposited on ALN films by hot filament CVD. The nucleation density of diamond on ALN films was found to be approximately 105 cm-2, whereas over 1010 cm-2 after negative bias pre-treatment for 35 min was -320 V, and 250 mA. The experimental studies have shown that the stresses were greatly minimized between diamond overlay and ALN films as compared with WC substrate. The results obtained have also confirmed that the ALN, as buffer layers, can notably enhance the adhesion force of diamond films on the WC.
    Original languageEnglish
    Pages (from-to)1660-1663
    JournalDiamond and Related Materials
    Volume9
    Issue number9
    DOIs
    Publication statusPublished - Sept 2000
    Event5th IUMRS International Conference on Advanced Materials (IUMRS-ICAM'99) - Beijing International Convention Centre, Beijing, China
    Duration: 13 Jun 199918 Jun 1999

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