TY - GEN
T1 - Notice of Removal
T2 - 2017 IEEE International Ultrasonics Symposium, IUS 2017
AU - Zhang, Shujun
AU - Li, Fei
AU - Shrout, Thomas
N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].
PY - 2017/10/31
Y1 - 2017/10/31
N2 - Piezoelectric materials are at the heart of electromechanical devices, such as medical imaging transducer, high intensity focused ultrasound (HIFU), industrial nondestructive evaluation (NDE) and piezoelectric sensors, to name a few. In this presentation, the advantages and disadvantages of piezoelectric materials are discussed based on the requirements (figure of merit) of various applications, with emphasis on recent developments of the high performance relaxor-PbTiO3 (PT) ferroelectric materials and high temperature nonferroelectric piezoelectric single crystals. © 2017 IEEE.
AB - Piezoelectric materials are at the heart of electromechanical devices, such as medical imaging transducer, high intensity focused ultrasound (HIFU), industrial nondestructive evaluation (NDE) and piezoelectric sensors, to name a few. In this presentation, the advantages and disadvantages of piezoelectric materials are discussed based on the requirements (figure of merit) of various applications, with emphasis on recent developments of the high performance relaxor-PbTiO3 (PT) ferroelectric materials and high temperature nonferroelectric piezoelectric single crystals. © 2017 IEEE.
UR - https://www.scopus.com/pages/publications/85039423955
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-85039423955&origin=recordpage
U2 - 10.1109/ULTSYM.2017.8092383
DO - 10.1109/ULTSYM.2017.8092383
M3 - RGC 32 - Refereed conference paper (with host publication)
SN - 9781538633830
VL - 0
T3 - IEEE International Ultrasonics Symposium, IUS
BT - 2017 IEEE International Ultrasonics Symposium, IUS 2017
PB - IEEE Computer Society
Y2 - 6 September 2017 through 9 September 2017
ER -