Nonparametric inference for reversed mean models with panel count data

Li Liu, Wen Su, Guosheng Yin, Xingqiu Zhao, Ying Zhang

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

4 Citations (Scopus)

Abstract

Panel count data typically refer to data arising from studies with recurrent events, in which subjects are observed only at discrete time points rather than under continuous observations. We investigate a general situation where a recurrent event process is eventually truncated by an informative terminal event and we are particularly interested in behaviors of the recurrent event process near the terminal event. We propose a reversed mean model for estimating the mean function of the recurrent event process. We develop a two-stage sieve likelihood-based method to estimate the mean function, which overcomes the computational difficulties arising from a nuisance functional parameter involved in the likelihood. The consistency and the convergence rate of the two-stage estimator are established. Allowing for the convergence rate slower than the standard rate, we develop the general weak convergence theory of M-estimators with a nuisance functional parameter, and then apply it to the proposed estimator for deriving the asymptotic normality. Furthermore, a class of two-sample tests is developed. The proposed methods are evaluated with extensive simulation studies and illustrated with panel count data from the Chinese Longitudinal Healthy Longevity Study. © 2022 ISI/BS.
Original languageEnglish
Pages (from-to)2968-2997
Number of pages30
JournalBernoulli
Volume28
Issue number4
Online published17 Aug 2022
DOIs
Publication statusPublished - Nov 2022
Externally publishedYes

Research Keywords

  • Nonparametric tests
  • recurrent events
  • reversed mean model
  • terminal event

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