Abstract
Identifying non-line-of-sight (NLOS) conditions is important to discard, or improve, any location estimates that have been estimated with NLOS ranges. Typically, NLOS identification relies on channel statistics that have been collected for both LOS and NLOS channels. We investigate NLOS identification using distance residuals instead. The results show that distance residuals can be used to identify location estimates with NLOS ranges with very high accuracy, and that in some cases, individual NLOS ranges can also be identified.
| Original language | English |
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| Title of host publication | Proceedings |
| Subtitle of host publication | IECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society |
| Publisher | IEEE |
| Pages | 4489-4493 |
| ISBN (Electronic) | 978-1-7281-5414-5 |
| ISBN (Print) | 978-1-7281-5415-2 |
| DOIs | |
| Publication status | Published - Oct 2020 |
| Event | 46th Annual Conference of the IEEE Industrial Electronics Society (IECON 2020) - Virtual, Singapore Duration: 19 Oct 2020 → 21 Oct 2020 https://www.iecon2020.org/ |
Publication series
| Name | IECON Proceedings (Industrial Electronics Conference) |
|---|---|
| ISSN (Print) | 1553-572X |
| ISSN (Electronic) | 2577-1647 |
Conference
| Conference | 46th Annual Conference of the IEEE Industrial Electronics Society (IECON 2020) |
|---|---|
| Place | Singapore |
| Period | 19/10/20 → 21/10/20 |
| Internet address |
Research Keywords
- localization
- non-line-of-sight
- wireless sensor networks