Abstract
The maximum free-electron concentration is observed to increase dramatically with the nitrogen content x in heavily Se-doped Ga1-3xIn3xNxAs1-x (0≤x19 cm-3 was observed at x=0.033; a value more than 20 times larger than that observed in GaAs films grown under similar conditions. It is shown that the increase is caused by a combination of two effects: (1) a downward shift of the conduction band and (2) an increase of the electron effective mass caused by flattening of the conduction-band minimum. Both these effects are due to modifications to the conduction-band structure caused by an anticrossing interaction of a localized N state and the conduction band of the III-V host. ©2000 The American Physical Society.
| Original language | English |
|---|---|
| Journal | Physical Review B - Condensed Matter and Materials Physics |
| Volume | 61 |
| Issue number | 20 |
| DOIs | |
| Publication status | Published - 15 May 2000 |
| Externally published | Yes |
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