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Nitrogen-induced increase of the maximum electron concentration in group III-N-V alloys

K. M. Yu, W. Walukiewicz, W. Shan, J. W. Ager III, J. Wu, E. E. Haller, J. F. Geisz, D. J. Friedman, J. M. Olson

Research output: Journal Publications and ReviewsRGC 22 - Publication in policy or professional journal

Abstract

The maximum free-electron concentration is observed to increase dramatically with the nitrogen content x in heavily Se-doped Ga1-3xIn3xNxAs1-x (0≤x19 cm-3 was observed at x=0.033; a value more than 20 times larger than that observed in GaAs films grown under similar conditions. It is shown that the increase is caused by a combination of two effects: (1) a downward shift of the conduction band and (2) an increase of the electron effective mass caused by flattening of the conduction-band minimum. Both these effects are due to modifications to the conduction-band structure caused by an anticrossing interaction of a localized N state and the conduction band of the III-V host. ©2000 The American Physical Society.
Original languageEnglish
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume61
Issue number20
DOIs
Publication statusPublished - 15 May 2000
Externally publishedYes

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