Nitrogen binding behavior in ZnO films with time-resolved cathodoluminescence

Y. F. Mei; Ricky K.Y. Fu; G. G. Siu; K. W. Wong; Paul K. Chu; R. S. Wang; H. C. Ong

doi:10.1016/j.apsusc.2005.10.031

Nitrogen binding behavior in ZnO films with time-resolved cathodoluminescence

Y. F. Mei, Ricky K.Y. Fu, G. G. Siu, K. W. Wong, Paul K. Chu, R. S. Wang, H. C. Ong

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

12 Citations (Scopus)

Abstract

ZnO film with (1 0 0) orientation was produced on silicon substrate and doped with nitrogen using plasma immersion ion implantation. The effects due to N doping were investigated using cathodoluminescence (CL). In the heavily nitrogen-doped ZnO film, the intensity of ultraviolet (UV) band decreases and that of the visible band increases as a function of the electron bombardment cycle i.e. time. Based on the X-ray photoelectron spectroscopy (XPS) analysis, the unstable Zn{single bond}N bond is responsible for the CL behavior and the experimental results agree well with the first-principle calculation. Our work is helpful to our understanding of the role of p-type dopants in ZnO. © 2005 Elsevier B.V. All rights reserved.

Original language	English
Pages (from-to)	8131-8134
Journal	Applied Surface Science
Volume	252
Issue number	23
DOIs	https://doi.org/10.1016/j.apsusc.2005.10.031
Publication status	Published - 30 Sept 2006

Research Keywords

Cathodoluminescence
Nitrogen binding
Photoelectron spectroscopy

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10.1016/j.apsusc.2005.10.031

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title = "Nitrogen binding behavior in ZnO films with time-resolved cathodoluminescence",

abstract = "ZnO film with (1 0 0) orientation was produced on silicon substrate and doped with nitrogen using plasma immersion ion implantation. The effects due to N doping were investigated using cathodoluminescence (CL). In the heavily nitrogen-doped ZnO film, the intensity of ultraviolet (UV) band decreases and that of the visible band increases as a function of the electron bombardment cycle i.e. time. Based on the X-ray photoelectron spectroscopy (XPS) analysis, the unstable Zn{single bond}N bond is responsible for the CL behavior and the experimental results agree well with the first-principle calculation. Our work is helpful to our understanding of the role of p-type dopants in ZnO. {\textcopyright} 2005 Elsevier B.V. All rights reserved.",

keywords = "Cathodoluminescence, Nitrogen binding, Photoelectron spectroscopy",

author = "Mei, {Y. F.} and Fu, {Ricky K.Y.} and Siu, {G. G.} and Wong, {K. W.} and Chu, {Paul K.} and Wang, {R. S.} and Ong, {H. C.}",

year = "2006",

month = sep,

day = "30",

doi = "10.1016/j.apsusc.2005.10.031",

language = "English",

volume = "252",

pages = "8131--8134",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier B.V.",

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TY - JOUR

T1 - Nitrogen binding behavior in ZnO films with time-resolved cathodoluminescence

AU - Mei, Y. F.

AU - Fu, Ricky K.Y.

AU - Siu, G. G.

AU - Wong, K. W.

AU - Chu, Paul K.

AU - Wang, R. S.

AU - Ong, H. C.

PY - 2006/9/30

Y1 - 2006/9/30

N2 - ZnO film with (1 0 0) orientation was produced on silicon substrate and doped with nitrogen using plasma immersion ion implantation. The effects due to N doping were investigated using cathodoluminescence (CL). In the heavily nitrogen-doped ZnO film, the intensity of ultraviolet (UV) band decreases and that of the visible band increases as a function of the electron bombardment cycle i.e. time. Based on the X-ray photoelectron spectroscopy (XPS) analysis, the unstable Zn{single bond}N bond is responsible for the CL behavior and the experimental results agree well with the first-principle calculation. Our work is helpful to our understanding of the role of p-type dopants in ZnO. © 2005 Elsevier B.V. All rights reserved.

AB - ZnO film with (1 0 0) orientation was produced on silicon substrate and doped with nitrogen using plasma immersion ion implantation. The effects due to N doping were investigated using cathodoluminescence (CL). In the heavily nitrogen-doped ZnO film, the intensity of ultraviolet (UV) band decreases and that of the visible band increases as a function of the electron bombardment cycle i.e. time. Based on the X-ray photoelectron spectroscopy (XPS) analysis, the unstable Zn{single bond}N bond is responsible for the CL behavior and the experimental results agree well with the first-principle calculation. Our work is helpful to our understanding of the role of p-type dopants in ZnO. © 2005 Elsevier B.V. All rights reserved.

KW - Cathodoluminescence

KW - Nitrogen binding

KW - Photoelectron spectroscopy

UR - http://www.scopus.com/inward/record.url?scp=33748290047&partnerID=8YFLogxK

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-33748290047&origin=recordpage

U2 - 10.1016/j.apsusc.2005.10.031

DO - 10.1016/j.apsusc.2005.10.031

M3 - RGC 21 - Publication in refereed journal

SN - 0169-4332

VL - 252

SP - 8131

EP - 8134

JO - Applied Surface Science

JF - Applied Surface Science

IS - 23

ER -

Nitrogen binding behavior in ZnO films with time-resolved cathodoluminescence

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