Neural network for improving the performance of nearest neighbor classifiers

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

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Author(s)

Detail(s)

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherPubl by Int Soc for Optical Engineering
Pages480-488
Volume1766
ISBN (Print)819409391
Publication statusPublished - 1992
Externally publishedYes

Publication series

Name
Volume1766
ISSN (Electronic)0277-786X

Conference

TitleNeural and Stochastic Methods in Image and Signal Processing
CitySan Diego, CA, USA
Period20 - 23 July 1992

Abstract

In a nearest neighbor classifier, an input sample is assigned to the class of the nearest prototype. The decision rule is simple and robust. However, it is computationally expensive in terms of memory space and computer time to implement a nearest neighbor classifier if each training sample is stored as a prototype and used to compare with every testing sample. The performance of the classifier is degraded if only a small number of training samples are used as prototypes. An algorithm is presented in this paper for modifying the prototypes so that the classification rate can be increased. This algorithm makes use of a two-layer perceptron with one second order input. The perceptron is trained and mapped back to a new nearest neighbor classifier. It is shown that the new classifier with only a small number of prototypes can even perform better than the classifier that uses all training samples as prototypes.

Citation Format(s)

Neural network for improving the performance of nearest neighbor classifiers. / Yan, Hong.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 1766 Publ by Int Soc for Optical Engineering, 1992. p. 480-488.

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review