Near-field scanning optical microscopic studies of micro-ring resonators

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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Author(s)

  • Gregory H. Vander Rhodes
  • Bennett B. Goldberg
  • M. Selim Unlu
  • Sai Tak Chu
  • Brent E. Little

Detail(s)

Original languageEnglish
Pages (from-to)552-553
Journal / PublicationConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume2
Publication statusPublished - 1999
Externally publishedYes

Conference

TitleProceedings of the 1999 12th Annual Meeting IEEE Lasers and Electro-Optics Society (LEOS'99)
CitySan Francisco, CA, USA
Period8 - 11 November 1999

Abstract

Near-field scanning optical microscopy (NSOM) can be used to measure internal optical intensity within both basic and novel guided-wave structures. This method has a number of advantages over other methods, including the ability to distinguish scattered from guided light and determine the vectorial components of the wavevector, all with a minimum amount of perturbation.

Citation Format(s)

Near-field scanning optical microscopic studies of micro-ring resonators. / Vander Rhodes, Gregory H.; Goldberg, Bennett B.; Unlu, M. Selim et al.
In: Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS, Vol. 2, 1999, p. 552-553.

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review