Near field imaging from multilayer lens

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

2 Scopus Citations
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Author(s)

  • Guixin Li
  • Jensen Li
  • H. L. Tam
  • C. T. Chan
  • K. W. Cheah

Detail(s)

Original languageEnglish
Pages (from-to)10725-10728
Journal / PublicationJournal of Nanoscience and Nanotechnology
Volume11
Issue number12
Publication statusPublished - 2011

Abstract

Multilayer superlens has been reported that it had advantages over the single metal layer superlens. In this work, single silver layer and Ag-SiO 2 multilayer superlens devices working at wavelength of 365 nm were fabricated using standard photolithography method. Grating objects with line/space (190 nm/190 nm) resolution could be resolved through both kinds of lens structures with working distance up to 128 nm. However, Ag-SiO 2 multilayer lens shows higher transmittance and image contrast than the single silver layer device, the experimental result proves the theoretical calculation. Copyright © 2011 American Scientific Publishers All rights reserved.

Research Area(s)

  • Imaging, Near field, Subwavelength, Superlens

Citation Format(s)

Near field imaging from multilayer lens. / Li, Guixin; Li, Jensen; Tam, H. L.; Chan, C. T.; Cheah, K. W.

In: Journal of Nanoscience and Nanotechnology, Vol. 11, No. 12, 2011, p. 10725-10728.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review