TY - JOUR
T1 - Nature and light dependence of bulk recombination in Co-Pi-catalyzed BiVO 4 photoanodes
AU - Abdi, Fatwa F.
AU - Van De Krol, Roel
N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].
PY - 2012/5/3
Y1 - 2012/5/3
N2 - BiVO 4 is considered to be a promising photoanode material for solar water splitting applications. Its performance is limited by two main factors: slow water oxidation kinetics and poor charge separation. We confirm recent reports that cobalt phosphate (Co-Pi) is an efficient water oxidation catalyst for BiVO 4 and report an AM1.5 photocurrent of 1.7 mA/cm 2 at 1.23 V vs RHE for 100 nm spray-deposited, compact, and undoped BiVO 4 films with an optimized Co-Pi film thickness of 30 nm. The charge separation of these films depends strongly on light intensity, ranging from 90% at low light intensities to less than 20% at intensities corresponding to 1 sun. These observations indicate that the charge separation efficiency in BiVO 4 is limited by poor electron transport and not by the presence of bulk defect states, interface traps, or the presence of a Schottky junction at the back-contact. © 2012 American Chemical Society.
AB - BiVO 4 is considered to be a promising photoanode material for solar water splitting applications. Its performance is limited by two main factors: slow water oxidation kinetics and poor charge separation. We confirm recent reports that cobalt phosphate (Co-Pi) is an efficient water oxidation catalyst for BiVO 4 and report an AM1.5 photocurrent of 1.7 mA/cm 2 at 1.23 V vs RHE for 100 nm spray-deposited, compact, and undoped BiVO 4 films with an optimized Co-Pi film thickness of 30 nm. The charge separation of these films depends strongly on light intensity, ranging from 90% at low light intensities to less than 20% at intensities corresponding to 1 sun. These observations indicate that the charge separation efficiency in BiVO 4 is limited by poor electron transport and not by the presence of bulk defect states, interface traps, or the presence of a Schottky junction at the back-contact. © 2012 American Chemical Society.
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U2 - 10.1021/jp3007552
DO - 10.1021/jp3007552
M3 - RGC 21 - Publication in refereed journal
SN - 1932-7447
VL - 116
SP - 9398
EP - 9404
JO - The Journal of Physical Chemistry C
JF - The Journal of Physical Chemistry C
IS - 17
ER -