Narrowed-Dielectric Microstrip Line (N-DML) Analysis and Test for THz Applications

Research output: Conference PapersRGC 32 - Refereed conference paper (without host publication)peer-review

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Author(s)

  • Haotian ZHU
  • Quan XUE
  • Leung CHIU
  • Shaowei LIAO
  • Xinghai ZHAO

Detail(s)

Original languageEnglish
Publication statusPublished - 11 Oct 2014

Conference

Title15th IEEE HK AP/MTT Postgraduate Conference
LocationThe Chinese University of Hong Kong
PlaceHong Kong
Period11 October 2014

Citation Format(s)

Narrowed-Dielectric Microstrip Line (N-DML) Analysis and Test for THz Applications. / ZHU, Haotian; XUE, Quan; CHIU, Leung et al.
2014. Paper presented at 15th IEEE HK AP/MTT Postgraduate Conference, Hong Kong.

Research output: Conference PapersRGC 32 - Refereed conference paper (without host publication)peer-review