Nano-structured TiN/TiBN multilayer thin films

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Detail(s)

Original languageEnglish
Pages (from-to)889-892
Journal / PublicationKey Engineering Materials
Volume334-335 II
Publication statusPublished - 2007

Abstract

Nano-structured TiN/TiBN multilayer thin films were deposited onto unheated Si(100) substrates by reactive unbalanced dc-magnetron sputtering in an Ar-N2 gas mixture at a pulsed-bias voltage of -60 V. The effects of the bilayer thickness (Λ = 1.8-7.7 nm) on microstructures and mechanical properties have been analyzed using X-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM), and microindentation measurements. Microstructure studies revealed that the TiN layers were fcc Bl-NaCl structure comprising of (111)- and (200)-oriented grains depending on Λ, while the TiBN layers were amorphous. Significant relationships were found between hardness (H) and Λ. A maximum hardness of ∼30 GPa was observed in a multilayer film with Λ = 1.8 nm. The possible hardness enhancement mechanism was also discussed.

Research Area(s)

  • Hardness, Magnetron sputtering, TiN/TiBN multilayer, Transmission electron microscopy, X-ray diffraction