Nanoscale polarization relaxation of epitaxial BiFeO3 thin film

Weigang Chen; Lu You; Gaofeng Chen; Ngeah Theng Chua; Ong Hock Guan; Xi Zou; Junling Wang; Lang Chen

doi:10.1016/j.tsf.2010.03.089

Nanoscale polarization relaxation of epitaxial BiFeO₃ thin film

Weigang Chen, Lu You, Gaofeng Chen, Ngeah Theng Chua, Ong Hock Guan, Xi Zou, Junling Wang, Lang Chen

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

6 Citations (Scopus)

Abstract

The polarization relaxation phenomenon in a 40-nm-thick epitaxial BiFeO₃ thin film grown on a (001) SrTiO₃ substrate with SrRuO₃ bottom electrode, was studied in nanoscale using dual-frequency resonance-tracking piezoresponse force microscopy. The as-grown film shows highly irregular mosaic domain pattern. The nucleation of reversed domains followed by domain wall propagation and domain coalesce was observed during relaxations. The polarization relaxation follows a stretched exponential model f = 1 - e^{-k(t - t0)n} with parameters t₀ = 2894 s, n = 0.50 and k = 6.04e- 4. Local polar defects act as nucleation centers and the time-dependent depolarization field is the driving force for polarization relaxation. © 2010 Elsevier B.V.

Original language	English
Journal	Thin Solid Films
Volume	518
Issue number	24 SUPPL.
DOIs	https://doi.org/10.1016/j.tsf.2010.03.089
Publication status	Published - 1 Oct 2010
Externally published	Yes

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Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

Research Keywords

Bismuth ferrite
Ferroelectricity
Piezoresponse force microscopy
Polarization relaxation

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@article{138478076b7c4194b30a70eed2222a81,

title = "Nanoscale polarization relaxation of epitaxial BiFeO3 thin film",

abstract = "The polarization relaxation phenomenon in a 40-nm-thick epitaxial BiFeO3 thin film grown on a (001) SrTiO3 substrate with SrRuO3 bottom electrode, was studied in nanoscale using dual-frequency resonance-tracking piezoresponse force microscopy. The as-grown film shows highly irregular mosaic domain pattern. The nucleation of reversed domains followed by domain wall propagation and domain coalesce was observed during relaxations. The polarization relaxation follows a stretched exponential model f = 1 - e-k(t - t0)n with parameters t0 = 2894 s, n = 0.50 and k = 6.04e- 4. Local polar defects act as nucleation centers and the time-dependent depolarization field is the driving force for polarization relaxation. {\textcopyright} 2010 Elsevier B.V.",

keywords = "Bismuth ferrite, Ferroelectricity, Piezoresponse force microscopy, Polarization relaxation",

author = "Weigang Chen and Lu You and Gaofeng Chen and Chua, {Ngeah Theng} and Guan, {Ong Hock} and Xi Zou and Junling Wang and Lang Chen",

note = "Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].",

year = "2010",

month = oct,

day = "1",

doi = "10.1016/j.tsf.2010.03.089",

language = "English",

volume = "518",

journal = "Thin Solid Films",

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TY - JOUR

T1 - Nanoscale polarization relaxation of epitaxial BiFeO3 thin film

AU - Chen, Weigang

AU - You, Lu

AU - Chen, Gaofeng

AU - Chua, Ngeah Theng

AU - Guan, Ong Hock

AU - Zou, Xi

AU - Wang, Junling

AU - Chen, Lang

N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

PY - 2010/10/1

Y1 - 2010/10/1

N2 - The polarization relaxation phenomenon in a 40-nm-thick epitaxial BiFeO3 thin film grown on a (001) SrTiO3 substrate with SrRuO3 bottom electrode, was studied in nanoscale using dual-frequency resonance-tracking piezoresponse force microscopy. The as-grown film shows highly irregular mosaic domain pattern. The nucleation of reversed domains followed by domain wall propagation and domain coalesce was observed during relaxations. The polarization relaxation follows a stretched exponential model f = 1 - e-k(t - t0)n with parameters t0 = 2894 s, n = 0.50 and k = 6.04e- 4. Local polar defects act as nucleation centers and the time-dependent depolarization field is the driving force for polarization relaxation. © 2010 Elsevier B.V.

AB - The polarization relaxation phenomenon in a 40-nm-thick epitaxial BiFeO3 thin film grown on a (001) SrTiO3 substrate with SrRuO3 bottom electrode, was studied in nanoscale using dual-frequency resonance-tracking piezoresponse force microscopy. The as-grown film shows highly irregular mosaic domain pattern. The nucleation of reversed domains followed by domain wall propagation and domain coalesce was observed during relaxations. The polarization relaxation follows a stretched exponential model f = 1 - e-k(t - t0)n with parameters t0 = 2894 s, n = 0.50 and k = 6.04e- 4. Local polar defects act as nucleation centers and the time-dependent depolarization field is the driving force for polarization relaxation. © 2010 Elsevier B.V.

KW - Bismuth ferrite

KW - Ferroelectricity

KW - Piezoresponse force microscopy

KW - Polarization relaxation

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UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-77957691029&origin=recordpage

U2 - 10.1016/j.tsf.2010.03.089

DO - 10.1016/j.tsf.2010.03.089

M3 - RGC 21 - Publication in refereed journal

SN - 0040-6090

VL - 518

JO - Thin Solid Films

JF - Thin Solid Films

IS - 24 SUPPL.

ER -