Abstract
The polarization relaxation phenomenon in a 40-nm-thick epitaxial BiFeO3 thin film grown on a (001) SrTiO3 substrate with SrRuO3 bottom electrode, was studied in nanoscale using dual-frequency resonance-tracking piezoresponse force microscopy. The as-grown film shows highly irregular mosaic domain pattern. The nucleation of reversed domains followed by domain wall propagation and domain coalesce was observed during relaxations. The polarization relaxation follows a stretched exponential model f = 1 - e-k(t - t0)n with parameters t0 = 2894 s, n = 0.50 and k = 6.04e- 4. Local polar defects act as nucleation centers and the time-dependent depolarization field is the driving force for polarization relaxation. © 2010 Elsevier B.V.
Original language | English |
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Journal | Thin Solid Films |
Volume | 518 |
Issue number | 24 SUPPL. |
DOIs | |
Publication status | Published - 1 Oct 2010 |
Externally published | Yes |
Bibliographical note
Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].Research Keywords
- Bismuth ferrite
- Ferroelectricity
- Piezoresponse force microscopy
- Polarization relaxation