Nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films

Yajun Qi; Chuanwei Huang; Zuhuang Chen; Zhenlin Luo; Yiqian Wang; Jun Guo; Tim White; Junling Wang; Chen Gao; Thirumany Sritharan; Lang Chen

doi:10.1063/1.3644958

Nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films

Yajun Qi
, Chuanwei Huang
, Zuhuang Chen
, Zhenlin Luo
, Yiqian Wang
, Jun Guo
, Tim White
, Junling Wang
, Chen Gao
, Thirumany Sritharan
, Lang Chen

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

9 Citations (Scopus)

Abstract

Nanoscale phase separation was investigated in epitaxial strained BiFeO₃ thin films on LaAlO₃ single crystal substrate. In biaxial strained thin films, nanoscale mixtures of the tetragonal-like and rhombohedral-like phases occur with a film thickness above 35 nm. For 10-30 nm ultrathin ones, tetragonal-like single phase is confirmed using synchrotron x-ray and the atomic force microscopy studies. However, nanoscale phase separations are still observed in quasi-uniaxial transmission electron microscopy foil specimens for those ultrathin films, indicating the phase separation emerges in a much smaller thickness in uniaxial constraint films than that in biaxial ones. © 2011 American Institute of Physics.

Original language	English
Article number	132905
Journal	Applied Physics Letters
Volume	99
Issue number	13
DOIs	https://doi.org/10.1063/1.3644958
Publication status	Published - 26 Sept 2011
Externally published	Yes

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Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

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title = "Nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films",

abstract = "Nanoscale phase separation was investigated in epitaxial strained BiFeO3 thin films on LaAlO3 single crystal substrate. In biaxial strained thin films, nanoscale mixtures of the tetragonal-like and rhombohedral-like phases occur with a film thickness above 35 nm. For 10-30 nm ultrathin ones, tetragonal-like single phase is confirmed using synchrotron x-ray and the atomic force microscopy studies. However, nanoscale phase separations are still observed in quasi-uniaxial transmission electron microscopy foil specimens for those ultrathin films, indicating the phase separation emerges in a much smaller thickness in uniaxial constraint films than that in biaxial ones. {\textcopyright} 2011 American Institute of Physics.",

author = "Yajun Qi and Chuanwei Huang and Zuhuang Chen and Zhenlin Luo and Yiqian Wang and Jun Guo and Tim White and Junling Wang and Chen Gao and Thirumany Sritharan and Lang Chen",

note = "Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].",

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language = "English",

volume = "99",

journal = "Applied Physics Letters",

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TY - JOUR

T1 - Nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films

AU - Qi, Yajun

AU - Huang, Chuanwei

AU - Chen, Zuhuang

AU - Luo, Zhenlin

AU - Wang, Yiqian

AU - Guo, Jun

AU - White, Tim

AU - Wang, Junling

AU - Gao, Chen

AU - Sritharan, Thirumany

AU - Chen, Lang

N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

PY - 2011/9/26

Y1 - 2011/9/26

N2 - Nanoscale phase separation was investigated in epitaxial strained BiFeO3 thin films on LaAlO3 single crystal substrate. In biaxial strained thin films, nanoscale mixtures of the tetragonal-like and rhombohedral-like phases occur with a film thickness above 35 nm. For 10-30 nm ultrathin ones, tetragonal-like single phase is confirmed using synchrotron x-ray and the atomic force microscopy studies. However, nanoscale phase separations are still observed in quasi-uniaxial transmission electron microscopy foil specimens for those ultrathin films, indicating the phase separation emerges in a much smaller thickness in uniaxial constraint films than that in biaxial ones. © 2011 American Institute of Physics.

AB - Nanoscale phase separation was investigated in epitaxial strained BiFeO3 thin films on LaAlO3 single crystal substrate. In biaxial strained thin films, nanoscale mixtures of the tetragonal-like and rhombohedral-like phases occur with a film thickness above 35 nm. For 10-30 nm ultrathin ones, tetragonal-like single phase is confirmed using synchrotron x-ray and the atomic force microscopy studies. However, nanoscale phase separations are still observed in quasi-uniaxial transmission electron microscopy foil specimens for those ultrathin films, indicating the phase separation emerges in a much smaller thickness in uniaxial constraint films than that in biaxial ones. © 2011 American Institute of Physics.

UR - https://www.scopus.com/pages/publications/80053478889

UR - https://www.scopus.com/pages/publications/80053478889#tab=impact

U2 - 10.1063/1.3644958

DO - 10.1063/1.3644958

M3 - RGC 21 - Publication in refereed journal

SN - 0003-6951

VL - 99

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 13

M1 - 132905

ER -

Nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films

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