Nanocrystals formation and fractal microstructural assessment in Au/Ge bilayer films upon annealing

Z. W. Chen; J. K L Lai; C. H. Shek; H. D. Chen

doi:10.1016/j.apsusc.2004.12.022

Author(s)

Z. W. Chen
J. K L Lai
C. H. Shek
H. D. Chen

Detail(s)

Original language	English
Pages (from-to)	3-8
Journal / Publication	Applied Surface Science
Volume	250
Issue number	1-4
Publication status	Published - 31 Aug 2005

Link(s)

DOI	DOI https://doi.org/10.1016/j.apsusc.2004.12.022 Final Published version
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Link to Scopus	https://www.scopus.com/record/display.uri?eid=2-s2.0-23844454294&origin=recordpage
Permanent Link	https://scholars.cityu.edu.hk/en/publications/publication(5a10f6cd-6f8b-413c-b809-b70000b223c2).html

Abstract

Nanocrystals formation and fractal microstructural assessment in Au/Ge bilayer films upon annealing have been investigated by transmission electron microscopy and high-resolution transmission electron microscopy observations. Experimental results indicated that the microstructure of the metal Au film plays an important role in metal-induced crystallization for Au/Ge bilayer films upon annealing. Synchronously, the crystallization processes of amorphous Ge accompanied by the formation of Ge fractal clusters, which were composed of Ge nanocrystals. We found that the grain boundaries of polycrystalline Au film were the initial nucleation sites of Ge nanocrystals. High-resolution transmission electron microscopy observations showed successive nucleation of amorphous Ge at Au grain boundaries near fractal tips. The crystallization process was suggested to be diffusion controlled and a random successive nucleation and growth mechanism. © 2004 Elsevier B.V. All rights reserved.

Research Area(s)

Au/Ge bilayer films, Fractal, HRTEM, Nanocrystal

Citation Format(s)

[ RIS ] [ BibTeX ]

Nanocrystals formation and fractal microstructural assessment in Au/Ge bilayer films upon annealing. / Chen, Z. W.; Lai, J. K L ; Shek, C. H. et al.
In: Applied Surface Science, Vol. 250, No. 1-4, 31.08.2005, p. 3-8.

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

Chen, ZW, Lai, JKL , Shek, CH & Chen, HD 2005, 'Nanocrystals formation and fractal microstructural assessment in Au/Ge bilayer films upon annealing', Applied Surface Science, vol. 250, no. 1-4, pp. 3-8. https://doi.org/10.1016/j.apsusc.2004.12.022

Chen, Z. W., Lai, J. K. L., Shek, C. H., & Chen, H. D. (2005). Nanocrystals formation and fractal microstructural assessment in Au/Ge bilayer films upon annealing. Applied Surface Science, 250(1-4), 3-8. https://doi.org/10.1016/j.apsusc.2004.12.022

Chen ZW, Lai JKL , Shek CH, Chen HD. Nanocrystals formation and fractal microstructural assessment in Au/Ge bilayer films upon annealing. Applied Surface Science. 2005 Aug 31;250(1-4):3-8. doi: 10.1016/j.apsusc.2004.12.022

Chen, Z. W. ; Lai, J. K L ; Shek, C. H. et al. / Nanocrystals formation and fractal microstructural assessment in Au/Ge bilayer films upon annealing. In: Applied Surface Science. 2005 ; Vol. 250, No. 1-4. pp. 3-8.