Abstract
The multiple ion-focusing effects in plasma immersion ion implantation was discussed. A simple geometric model was presented for understanding the ion focusing effect and the ion dose uniformity. It was demonstrated that the ion focusing originates from plasma sheath convergence which depends on time and space. It was also found that the multiple ion focusing may occur at different local sites depending on the target shape and processing parameters.
| Original language | English |
|---|---|
| Pages (from-to) | 3744-3746 |
| Journal | Applied Physics Letters |
| Volume | 81 |
| Issue number | 20 |
| DOIs | |
| Publication status | Published - 11 Nov 2002 |
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