Skip to main navigation Skip to search Skip to main content

Multichannel ellipsometry from 1.5 to 6.5 eV for real time characterization of wide band gap materials: Phase identification in boron nitride thin films

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

11   Link opens in a new tab Citations (Scopus)

Fingerprint

Dive into the research topics of 'Multichannel ellipsometry from 1.5 to 6.5 eV for real time characterization of wide band gap materials: Phase identification in boron nitride thin films'. Together they form a unique fingerprint.
Sort by

Physics

Material Science