Multiblock Concurrent PLS for Decentralized Monitoring of Continuous Annealing Processes

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Original languageEnglish
Article number6729046
Pages (from-to)6429-6437
Journal / PublicationIEEE Transactions on Industrial Electronics
Issue number11
Online published30 Jan 2014
Publication statusPublished - Nov 2014
Externally publishedYes


In this paper, a data-driven multiblock concurrent projection to latent structures (CPLS) method is proposed for monitoring large-scale manufacturing lines, particularly for cold rolling continuous annealing processes (CAPs) fault diagnosis. The proposed method provides decentralized process monitoring and helps localize faults in both input variables and output variables concurrently. First, the CPLS-based process monitoring method is briefly reviewed. Second, a multiblock CPLS algorithm, which incorporates process block partition, is proposed to diagnose faults relevant to process inputs or outputs with a decentralized structure. For the CAP line application, tension-specific variations, roll-specific variations, and tension-roll covariations are analyzed in each partitioned block. Furthermore, within the roll-specific subspace of an abnormal block, a delay-alignment scheme based on strip transportation delay is proposed to diagnose defective processing materials. © 1982-2012 IEEE.