TY - JOUR
T1 - Monitoring surface charge movement in single elongated semiconductor nanocrystals
AU - Müller, J.
AU - Lupton, J. M.
AU - Rogach, A. L.
AU - Feldmann, J.
AU - Talapin, D. V.
AU - Weller, H.
PY - 2004/10/15
Y1 - 2004/10/15
N2 - The surface charge movement in single elongated semiconductor nanocrystals (NC) was monitored. The photoluminescence (PL) measurements on single elongated NCs dispersed in a polystyrene matrix was also performed. For demonstrating the spectral diffusion in the elongated NC the PL spectra was compared with the same single particle measured at different times. It was found that the PL was excited using the 457.9 nm line of an argon ion laser at intensities of 25 W cm-2, collected with a long-distance microscopic objective.
AB - The surface charge movement in single elongated semiconductor nanocrystals (NC) was monitored. The photoluminescence (PL) measurements on single elongated NCs dispersed in a polystyrene matrix was also performed. For demonstrating the spectral diffusion in the elongated NC the PL spectra was compared with the same single particle measured at different times. It was found that the PL was excited using the 457.9 nm line of an argon ion laser at intensities of 25 W cm-2, collected with a long-distance microscopic objective.
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U2 - 10.1103/PhysRevLett.93.167402
DO - 10.1103/PhysRevLett.93.167402
M3 - RGC 21 - Publication in refereed journal
SN - 0031-9007
VL - 93
JO - Physical Review Letters
JF - Physical Review Letters
IS - 16
ER -