Modification of (Pb,La)(Zr,Ti)O3 thin films during pulsed laser liftoff from MgO substrates

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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Author(s)

  • L. Tsakalakos
  • T. Sands
  • E. Carleton
  • K. M. Yu

Detail(s)

Original languageEnglish
Pages (from-to)4047-4052
Journal / PublicationJournal of Applied Physics
Volume94
Issue number6
Publication statusPublished - 15 Sept 2003
Externally publishedYes

Abstract

Modification of (Pb,La)(Zr,Ti)O3 thin films during pulsed laser liftoff (LLO) from MgO substrates was investigated. Atomic force microscopy measurements of the film surface after LLO showed average surface roughness on the order of 90-100 nm. Transmission electron microscopy of the films showed that the surface layer consisted of an irregular amorphous layer ranging in thickness from 50 to 100 nm.

Citation Format(s)

Modification of (Pb,La)(Zr,Ti)O3 thin films during pulsed laser liftoff from MgO substrates. / Tsakalakos, L.; Sands, T.; Carleton, E. et al.
In: Journal of Applied Physics, Vol. 94, No. 6, 15.09.2003, p. 4047-4052.

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review