Modification of a Teng-Man technique to measure both r₃₃ and r₁₃ electro-optic coefficients

In this paper, we present a modified Teng-Man method to measure both electro-optic coefficients in a single measurement. Using our method, we confirm a linear dependence between the applied poling field and the measured electro-optic coefficients. The ratio between the two electro-optic coefficients is close to three, which is theoretically expected from a weakly oriented polymer film. Since conductive silicon is used as substrate, no auxiliary layers of transparent oxide or metal are required on the substrate, which simplifies both the sample preparation and the evaluation of the results.