TY - JOUR
T1 - Modification of a Teng-Man technique to measure both r33 and r13 electro-optic coefficients
AU - Prorok, Stefan
AU - Petrov, Alexander
AU - Eich, Manfred
AU - Luo, Jingdong
AU - Jen, Alex K.-Y.
PY - 2014/9/15
Y1 - 2014/9/15
N2 - In this paper, we present a modified Teng-Man method to measure both electro-optic coefficients in a single measurement. Using our method, we confirm a linear dependence between the applied poling field and the measured electro-optic coefficients. The ratio between the two electro-optic coefficients is close to three, which is theoretically expected from a weakly oriented polymer film. Since conductive silicon is used as substrate, no auxiliary layers of transparent oxide or metal are required on the substrate, which simplifies both the sample preparation and the evaluation of the results.
AB - In this paper, we present a modified Teng-Man method to measure both electro-optic coefficients in a single measurement. Using our method, we confirm a linear dependence between the applied poling field and the measured electro-optic coefficients. The ratio between the two electro-optic coefficients is close to three, which is theoretically expected from a weakly oriented polymer film. Since conductive silicon is used as substrate, no auxiliary layers of transparent oxide or metal are required on the substrate, which simplifies both the sample preparation and the evaluation of the results.
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U2 - 10.1063/1.4895939
DO - 10.1063/1.4895939
M3 - RGC 21 - Publication in refereed journal
SN - 0003-6951
VL - 105
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 11
M1 - 113302
ER -