Modeling of IC socket contact resistance for reliability and health monitoring applications

Research output: Journal Publications and ReviewsRGC 22 - Publication in policy or professional journal

4 Scopus Citations
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Author(s)

  • Leoncio D. Lopez
  • Michael G. Pecht

Related Research Unit(s)

Detail(s)

Original languageEnglish
Pages (from-to)264-270
Journal / PublicationIEEE Transactions on Reliability
Volume58
Issue number2
Publication statusPublished - 2009

Conference

Title2008 International Conference on Prognostics and Health Management
Location
PlaceUnited States
CityDenver
Period6 - 9 October 2008

Abstract

We present a methodology based on the physics of failure, and the sequential probability ratio test, for modeling and monitoring electrical interconnects in health monitoring, and electronic prognostic applications. The resistance behavior of an electrical contact was characterized as a function of temperature. The physics of failure of the contact technology were analysed. A contact resistance model was selected, and its parameters were fitted using the temperature characterization data. The physics of failure model was evaluated with a reliability application (temperature cycle test), and was found to produce estimation errors of <Ω during a training period. The temperature and resistance of ten sample contacts were continuously monitored during the temperature cycle test, identifying the maximum temperature and resistances for each cycle. Using the physics of failure model, maximum resistance estimates were generated for each test sample. The residual between the monitored and estimated resistance values was evaluated with the sequential probability ratio test. The method was shown to overcome the issues of traditional threshold-based monitoring approaches, providing accurate resistance estimates, and allowing the detection of abnormal resistance behavior with low false alarm and missed alarm probabilities. © 2009 IEEE.

Research Area(s)

  • Accelerated test, Contact resistance, Elastomer socket, Health monitoring, Physics of failure

Citation Format(s)

Modeling of IC socket contact resistance for reliability and health monitoring applications. / Lopez, Leoncio D.; Pecht, Michael G.
In: IEEE Transactions on Reliability, Vol. 58, No. 2, 2009, p. 264-270.

Research output: Journal Publications and ReviewsRGC 22 - Publication in policy or professional journal