MmM5/Mg multi-layer hydrogen storage thin films prepared by dc magnetron sputtering
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Journal / Publication | Journal of Alloys and Compounds |
Volume | 370 |
Issue number | 1-2 |
Publication status | Published - 12 May 2004 |
Link(s)
Abstract
MmNi3.5(CoAlMn)1.5/Mg (here Mm denoted for mischmetal) multi-layer thin films were deposited on (001) Si substrate by direct current (dc) magnetron sputtering with dual-target. X-ray diffraction (XRD) and scanning electron microscopy analysis revealed that the microstructure of the MmNi3.5(CoAlMn)1.5 layer is amorphous and/or nanocrystalline and that the microstructure of the Mg layer is fine grained crystalline with preferential orientation. Phase analysis of hydrogenated and dehydrogenated MmNi3.5(CoAlMn)1.5/Mg multi-layer thin films proved that an apparent absorption of hydrogen in the Mg layer occurs at temperatures higher than 200°C and that the hydrogen absorbed can be fully released at 250°C. © 2003 Elsevier B.V. All rights reserved.
Research Area(s)
- Hydrogen storage alloys, Magnesium (Mg), Nanostructured materials, Thin films
Citation Format(s)
MmM5/Mg multi-layer hydrogen storage thin films prepared by dc magnetron sputtering. / Wang, H.; Ouyang, L. Z.; Peng, C. H.; Zeng, M. Q.; Chung, C. Y.; Zhu, M.
In: Journal of Alloys and Compounds, Vol. 370, No. 1-2, 12.05.2004.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review