MmM5/Mg multi-layer hydrogen storage thin films prepared by dc magnetron sputtering

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

18 Scopus Citations
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Author(s)

  • H. Wang
  • L. Z. Ouyang
  • C. H. Peng
  • M. Q. Zeng
  • M. Zhu

Detail(s)

Original languageEnglish
Journal / PublicationJournal of Alloys and Compounds
Volume370
Issue number1-2
Publication statusPublished - 12 May 2004

Abstract

MmNi3.5(CoAlMn)1.5/Mg (here Mm denoted for mischmetal) multi-layer thin films were deposited on (001) Si substrate by direct current (dc) magnetron sputtering with dual-target. X-ray diffraction (XRD) and scanning electron microscopy analysis revealed that the microstructure of the MmNi3.5(CoAlMn)1.5 layer is amorphous and/or nanocrystalline and that the microstructure of the Mg layer is fine grained crystalline with preferential orientation. Phase analysis of hydrogenated and dehydrogenated MmNi3.5(CoAlMn)1.5/Mg multi-layer thin films proved that an apparent absorption of hydrogen in the Mg layer occurs at temperatures higher than 200°C and that the hydrogen absorbed can be fully released at 250°C. © 2003 Elsevier B.V. All rights reserved.

Research Area(s)

  • Hydrogen storage alloys, Magnesium (Mg), Nanostructured materials, Thin films

Citation Format(s)

MmM5/Mg multi-layer hydrogen storage thin films prepared by dc magnetron sputtering. / Wang, H.; Ouyang, L. Z.; Peng, C. H.; Zeng, M. Q.; Chung, C. Y.; Zhu, M.

In: Journal of Alloys and Compounds, Vol. 370, No. 1-2, 12.05.2004.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review