Misorientation-angle-dependent electrical transport across molybdenum disulfide grain boundaries

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

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Author(s)

  • David J. Perello
  • Jiong Zhao
  • Qingming Deng
  • Hyun Kim
  • Gang Hee Han
  • Sang Hoon Chae
  • Hye Yun Jeong
  • Young Hee Lee

Detail(s)

Original languageEnglish
Article number10426
Journal / PublicationNature Communications
Volume7
Publication statusPublished - 27 Jan 2016
Externally publishedYes

Link(s)

Abstract

Grain boundaries in monolayer transition metal dichalcogenides have unique atomic defect structures and band dispersion relations that depend on the inter-domain misorientation angle. Here, we explore misorientation angle-dependent electrical transport at grain boundaries in monolayer MoS2 by correlating the atomic defect structures of measured devices analysed with transmission electron microscopy and first-principles calculations. Transmission electron microscopy indicates that grain boundaries are primarily composed of 5-7 dislocation cores with periodicity and additional complex defects formed at high angles, obeying the classical low-angle theory for angles <22°. The inter-domain mobility is minimized for angles <9° and increases nonlinearly by two orders of magnitude before saturating at ∼16 cm2 V-1 s-1 around misorientation angle ≈20°. This trend is explained via grain-boundary electrostatic barriers estimated from density functional calculations and experimental tunnelling barrier heights, which are ≈0.5 eV at low angles and ≈0.15 eV at high angles (≥20°).

Research Area(s)

Citation Format(s)

Misorientation-angle-dependent electrical transport across molybdenum disulfide grain boundaries. / Ly, Thuc Hue; Perello, David J.; Zhao, Jiong; Deng, Qingming; Kim, Hyun; Han, Gang Hee; Chae, Sang Hoon; Jeong, Hye Yun; Lee, Young Hee.

In: Nature Communications, Vol. 7, 10426, 27.01.2016.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review