Abstract
Appealed by the market, flash memory density is being increasingly improved, and the technology scale is being reduced. Currently, scaled multi-level-cell (MLC) flash memory has been the dominant in the global flash memory markets. However, the reliability of MLC flash memory becomes the urgent challenge, where cell-to-cell interference has been well recognized as the major error source. In this work, we propose to minimize cell-to-cell interference through exploiting the differential impacts on the multiple-bit of MLC flash memories. MLC flash memory generally has two or more bits per cell, such as 2-bit/cell or 4-bit/cell, which can be differentially interfered by neighboring cell programming. Based on the understanding of the programming characteristics of MLC flash memory, we found that higher-order bits can be higher interfered and be more significant interference sources. In order to understand the characteristics of cell-tocell interference on the multiple bits, we first present cell-to-cell interference models for multiple bits, respectively. Then based on the model, a state mapping scheme is designed to minimize cell-to-cell interference through mapping the states of high-order bits. The mapping scheme is motivated by the recent studies on the cell-to-cell interference characteristics of the multiple cell states of flash memory, where different states have varying interferences. In this case, high-order bits should be mapped from high interference states to a low one. A series of experiments show that the proposed scheme is efficient on reducing cell-to-cell interference with negligible overhead.
Original language | English |
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Title of host publication | 2016 5th Non-Volatile Memory Systems and Applications Symposium, NVMSA 2016 |
Publisher | IEEE |
ISBN (Print) | 9781509041367 |
DOIs | |
Publication status | Published - 17 Aug 2016 |
Event | 5th Non-Volatile Memory Systems and Applications Symposium, NVMSA 2016 - Daegu, Korea, Republic of Duration: 17 Aug 2016 → 19 Aug 2016 |
Conference
Conference | 5th Non-Volatile Memory Systems and Applications Symposium, NVMSA 2016 |
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Country/Territory | Korea, Republic of |
City | Daegu |
Period | 17/08/16 → 19/08/16 |