Minimizing cell-to-cell interference by exploiting differential bit impact characteristics of scaled MLC NAND flash memories

Yejia Di, Liang Shi*, Congming Gao, Kaijie Wu, Chun Jason Xue, Edwin H.M. Sha

*Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

3 Citations (Scopus)

Abstract

Appealed by the market, flash memory density is being increasingly improved, and the technology scale is being reduced. Currently, scaled multi-level-cell (MLC) flash memory has been the dominant in the global flash memory markets. However, the reliability of MLC flash memory becomes the urgent challenge, where cell-to-cell interference has been well recognized as the major error source. In this work, we propose to minimize cell-to-cell interference through exploiting the differential impacts on the multiple-bit of MLC flash memories. MLC flash memory generally has two or more bits per cell, such as 2-bit/cell or 4-bit/cell, which can be differentially interfered by neighboring cell programming. Based on the understanding of the programming characteristics of MLC flash memory, we found that higher-order bits can be higher interfered and be more significant interference sources. In order to understand the characteristics of cell-tocell interference on the multiple bits, we first present cell-to-cell interference models for multiple bits, respectively. Then based on the model, a state mapping scheme is designed to minimize cell-to-cell interference through mapping the states of high-order bits. The mapping scheme is motivated by the recent studies on the cell-to-cell interference characteristics of the multiple cell states of flash memory, where different states have varying interferences. In this case, high-order bits should be mapped from high interference states to a low one. A series of experiments show that the proposed scheme is efficient on reducing cell-to-cell interference with negligible overhead.
Original languageEnglish
Title of host publication2016 5th Non-Volatile Memory Systems and Applications Symposium, NVMSA 2016
PublisherIEEE
ISBN (Print)9781509041367
DOIs
Publication statusPublished - 17 Aug 2016
Event5th Non-Volatile Memory Systems and Applications Symposium, NVMSA 2016 - Daegu, Korea, Republic of
Duration: 17 Aug 201619 Aug 2016

Conference

Conference5th Non-Volatile Memory Systems and Applications Symposium, NVMSA 2016
Country/TerritoryKorea, Republic of
CityDaegu
Period17/08/1619/08/16

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