Microwave-induced elastic deformation of a metallic thin film
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Author(s)
Detail(s)
| Original language | English |
|---|---|
| Article number | 395104 |
| Journal / Publication | Journal of Physics D: Applied Physics |
| Volume | 46 |
| Issue number | 39 |
| Online published | 13 Sep 2013 |
| Publication status | Published - 2 Oct 2013 |
| Externally published | Yes |
Link(s)
Abstract
The microwave induced elastic deformation of a metallic thin film in a cavity structure is computed using a Maxwell stress tensor method and we found that the microwave can induce a significantly enhanced deformation at the anti-symmetric resonance mode, and the deformation magnitude is a few orders larger than that of the non-resonance case. The previous transmission line approach for the electromagnetic stress (Wang et al 2011 Phys. Rev. B 84 075114) is applied to develop an analytical model of deformation based on elastic theory. We show that the analytical model can reproduce the numerical results almost quantitatively and at the same time reveal the underlying physics.
Citation Format(s)
Microwave-induced elastic deformation of a metallic thin film. / Wang, S B ; Chan, C T.
In: Journal of Physics D: Applied Physics, Vol. 46, No. 39, 395104, 02.10.2013.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
