Microstructure of MmM5/Mg multi-layer films prepared by magnetron sputtering

L. Z. Ouyang; H. Wang; M. Zhu; J. Zou; C. Y. Chung

doi:10.1016/j.jallcom.2005.01.120

Microstructure of MmM₅/Mg multi-layer films prepared by magnetron sputtering

L. Z. Ouyang
, H. Wang
, M. Zhu
, J. Zou
, C. Y. Chung

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

26 Citations (Scopus)

Abstract

Microstructure of MmNi_3.5(CoAlMn)_1.5/Mg (here Mm denotes La-rich mischmetal) multi-layer hydrogen storage thin films prepared by direct current magnetron sputtering was investigated by cross-sectional transmission electron microscopy (XTEM). It was shown that the MmM₅ layers are composed of two regions: an amorphous region with a thickness of ∼ 4 nm at the bottom of the layers and a randomly orientated nanocrystallite region on the top of the amorphous region and the Mg layers consist of typical columnar crystallite with their [0 0 1] direction nearly parallel to the growth direction. The mechanism for the formation of the above microstructure characteristics in the multi-layer thin films has been proposed. Based on the microstructure feature of the multi-layer films, mechanism for the apparent improvement of hydrogen absorption/desorption kinetics was discussed. © 2005 Elsevier B.V. All rights reserved.

Original language	English
Pages (from-to)	485-489
Journal	Journal of Alloys and Compounds
Volume	404-406
Issue number	SPEC. ISS.
DOIs	https://doi.org/10.1016/j.jallcom.2005.01.120
Publication status	Published - 8 Dec 2005

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This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 7 Affordable and Clean Energy

Research Keywords

Hydrogen storage alloys
Magnetron sputtering
Multi-layer films
Transmission electron microscopy (TEM)

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10.1016/j.jallcom.2005.01.120

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Cite this

@article{dd63add52dee4bb59502feacd4e8223c,

title = "Microstructure of MmM5/Mg multi-layer films prepared by magnetron sputtering",

abstract = "Microstructure of MmNi3.5(CoAlMn)1.5/Mg (here Mm denotes La-rich mischmetal) multi-layer hydrogen storage thin films prepared by direct current magnetron sputtering was investigated by cross-sectional transmission electron microscopy (XTEM). It was shown that the MmM5 layers are composed of two regions: an amorphous region with a thickness of ∼ 4 nm at the bottom of the layers and a randomly orientated nanocrystallite region on the top of the amorphous region and the Mg layers consist of typical columnar crystallite with their [0 0 1] direction nearly parallel to the growth direction. The mechanism for the formation of the above microstructure characteristics in the multi-layer thin films has been proposed. Based on the microstructure feature of the multi-layer films, mechanism for the apparent improvement of hydrogen absorption/desorption kinetics was discussed. {\textcopyright} 2005 Elsevier B.V. All rights reserved.",

keywords = "Hydrogen storage alloys, Magnetron sputtering, Multi-layer films, Transmission electron microscopy (TEM)",

author = "Ouyang, \{L. Z.\} and H. Wang and M. Zhu and J. Zou and Chung, \{C. Y.\}",

year = "2005",

month = dec,

day = "8",

doi = "10.1016/j.jallcom.2005.01.120",

language = "English",

volume = "404-406",

pages = "485--489",

journal = "Journal of Alloys and Compounds",

issn = "0925-8388",

publisher = "Elsevier B.V.",

number = "SPEC. ISS.",

}

TY - JOUR

T1 - Microstructure of MmM5/Mg multi-layer films prepared by magnetron sputtering

AU - Ouyang, L. Z.

AU - Wang, H.

AU - Zhu, M.

AU - Zou, J.

AU - Chung, C. Y.

PY - 2005/12/8

Y1 - 2005/12/8

N2 - Microstructure of MmNi3.5(CoAlMn)1.5/Mg (here Mm denotes La-rich mischmetal) multi-layer hydrogen storage thin films prepared by direct current magnetron sputtering was investigated by cross-sectional transmission electron microscopy (XTEM). It was shown that the MmM5 layers are composed of two regions: an amorphous region with a thickness of ∼ 4 nm at the bottom of the layers and a randomly orientated nanocrystallite region on the top of the amorphous region and the Mg layers consist of typical columnar crystallite with their [0 0 1] direction nearly parallel to the growth direction. The mechanism for the formation of the above microstructure characteristics in the multi-layer thin films has been proposed. Based on the microstructure feature of the multi-layer films, mechanism for the apparent improvement of hydrogen absorption/desorption kinetics was discussed. © 2005 Elsevier B.V. All rights reserved.

AB - Microstructure of MmNi3.5(CoAlMn)1.5/Mg (here Mm denotes La-rich mischmetal) multi-layer hydrogen storage thin films prepared by direct current magnetron sputtering was investigated by cross-sectional transmission electron microscopy (XTEM). It was shown that the MmM5 layers are composed of two regions: an amorphous region with a thickness of ∼ 4 nm at the bottom of the layers and a randomly orientated nanocrystallite region on the top of the amorphous region and the Mg layers consist of typical columnar crystallite with their [0 0 1] direction nearly parallel to the growth direction. The mechanism for the formation of the above microstructure characteristics in the multi-layer thin films has been proposed. Based on the microstructure feature of the multi-layer films, mechanism for the apparent improvement of hydrogen absorption/desorption kinetics was discussed. © 2005 Elsevier B.V. All rights reserved.

KW - Hydrogen storage alloys

KW - Magnetron sputtering

KW - Multi-layer films

KW - Transmission electron microscopy (TEM)

UR - https://www.scopus.com/pages/publications/28144442149

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-28144442149&origin=recordpage

U2 - 10.1016/j.jallcom.2005.01.120

DO - 10.1016/j.jallcom.2005.01.120

M3 - RGC 21 - Publication in refereed journal

SN - 0925-8388

VL - 404-406

SP - 485

EP - 489

JO - Journal of Alloys and Compounds

JF - Journal of Alloys and Compounds

IS - SPEC. ISS.

ER -