Microscopy in solid state science

A. J. McGIBBON; L. M. BROWN; A. L. BLELOCH; N. D. BROWNING; F. Cadete Santos AIRES; P. J. FALLON; P. H. GASKELL; K. W. R. GILKES; P. L. HANSEN; A. HOWIE; A. D. MAYNARD; D. W. McCOMB; D. McMULLAN; H. MLLEJANS; Y. MUROOKA; J. H. PATERSON; D. D. PEROVIC; W. T. PIKE; I. A. RAUF; J. M. RODENBURG; A. SAEED; N. Stelmashenko; K. N. TU; M. G. WALLS; C. A. WALSH; J. YUAN; J. ZHAO

doi:10.1002/jemt.1070240404

Microscopy in solid state science

A. J. McGIBBON, L. M. BROWN, A. L. BLELOCH, N. D. BROWNING, F. Cadete Santos AIRES, P. J. FALLON, P. H. GASKELL, K. W. R. GILKES, P. L. HANSEN, A. HOWIE, A. D. MAYNARD, D. W. McCOMB, D. McMULLAN, H. MLLEJANS, Y. MUROOKA, J. H. PATERSON, D. D. PEROVIC, W. T. PIKE, I. A. RAUF, J. M. RODENBURGA. SAEED, N. Stelmashenko, K. N. TU, M. G. WALLS, C. A. WALSH, J. YUAN, J. ZHAO

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

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Abstract

The Microstructural Physics group at the Cavendish Laboratory is actively involved in a considerable number of research projects which cover a broad range of materials science. In this paper, we describe briefly several such projects, with particular emphasis given to the application of parallel-detection electron energy loss spectroscopy (PEELS) on a scanning transmission electron microscope (STEM) to the analysis of materials such as stainless steels, catalysts, and high temperature superconductors. In addition, we describe a number of related projects that are currently being carried out in the group, particularly those which utilise and develop novel STEM imaging and analytical techniques.

Original language	English
Pages (from-to)	299-315
Journal	Microscopy Research and Technique
Volume	24
Issue number	4
Online published	1 Mar 1993
DOIs	https://doi.org/10.1002/jemt.1070240404
Publication status	Published - 1 Mar 1993
Externally published	Yes

Research Keywords

HAADFI
Nanolithography
PEELS
STEM
STM
Superresolution

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McGIBBON, A. J., BROWN, L. M., BLELOCH, A. L., BROWNING, N. D., AIRES, F. C. S., FALLON, P. J., GASKELL, P. H., GILKES, K. W. R., HANSEN, P. L., HOWIE, A., MAYNARD, A. D., McCOMB, D. W., McMULLAN, D., MLLEJANS, H., MUROOKA, Y., PATERSON, J. H., PEROVIC, D. D., PIKE, W. T., RAUF, I. A., ... ZHAO, J. (1993). Microscopy in solid state science. Microscopy Research and Technique, 24(4), 299-315. https://doi.org/10.1002/jemt.1070240404

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abstract = "The Microstructural Physics group at the Cavendish Laboratory is actively involved in a considerable number of research projects which cover a broad range of materials science. In this paper, we describe briefly several such projects, with particular emphasis given to the application of parallel-detection electron energy loss spectroscopy (PEELS) on a scanning transmission electron microscope (STEM) to the analysis of materials such as stainless steels, catalysts, and high temperature superconductors. In addition, we describe a number of related projects that are currently being carried out in the group, particularly those which utilise and develop novel STEM imaging and analytical techniques.",

keywords = "HAADFI, Nanolithography, PEELS, STEM, STM, Superresolution",

author = "McGIBBON, {A. J.} and BROWN, {L. M.} and BLELOCH, {A. L.} and BROWNING, {N. D.} and AIRES, {F. Cadete Santos} and FALLON, {P. J.} and GASKELL, {P. H.} and GILKES, {K. W. R.} and HANSEN, {P. L.} and A. HOWIE and MAYNARD, {A. D.} and McCOMB, {D. W.} and D. McMULLAN and H. MLLEJANS and Y. MUROOKA and PATERSON, {J. H.} and PEROVIC, {D. D.} and PIKE, {W. T.} and RAUF, {I. A.} and RODENBURG, {J. M.} and A. SAEED and N. Stelmashenko and TU, {K. N.} and WALLS, {M. G.} and WALSH, {C. A.} and J. YUAN and J. ZHAO",

year = "1993",

month = mar,

day = "1",

doi = "10.1002/jemt.1070240404",

language = "English",

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McGIBBON, AJ, BROWN, LM, BLELOCH, AL, BROWNING, ND, AIRES, FCS, FALLON, PJ, GASKELL, PH, GILKES, KWR, HANSEN, PL, HOWIE, A, MAYNARD, AD, McCOMB, DW, McMULLAN, D, MLLEJANS, H, MUROOKA, Y, PATERSON, JH, PEROVIC, DD, PIKE, WT, RAUF, IA, RODENBURG, JM, SAEED, A, Stelmashenko, N, TU, KN, WALLS, MG, WALSH, CA, YUAN, J & ZHAO, J 1993, 'Microscopy in solid state science', Microscopy Research and Technique, vol. 24, no. 4, pp. 299-315. https://doi.org/10.1002/jemt.1070240404

TY - JOUR

T1 - Microscopy in solid state science

AU - McGIBBON, A. J.

AU - BROWN, L. M.

AU - BLELOCH, A. L.

AU - BROWNING, N. D.

AU - AIRES, F. Cadete Santos

AU - FALLON, P. J.

AU - GASKELL, P. H.

AU - GILKES, K. W. R.

AU - HANSEN, P. L.

AU - HOWIE, A.

AU - MAYNARD, A. D.

AU - McCOMB, D. W.

AU - McMULLAN, D.

AU - MLLEJANS, H.

AU - MUROOKA, Y.

AU - PATERSON, J. H.

AU - PEROVIC, D. D.

AU - PIKE, W. T.

AU - RAUF, I. A.

AU - RODENBURG, J. M.

AU - SAEED, A.

AU - Stelmashenko, N.

AU - TU, K. N.

AU - WALLS, M. G.

AU - WALSH, C. A.

AU - YUAN, J.

AU - ZHAO, J.

PY - 1993/3/1

Y1 - 1993/3/1

N2 - The Microstructural Physics group at the Cavendish Laboratory is actively involved in a considerable number of research projects which cover a broad range of materials science. In this paper, we describe briefly several such projects, with particular emphasis given to the application of parallel-detection electron energy loss spectroscopy (PEELS) on a scanning transmission electron microscope (STEM) to the analysis of materials such as stainless steels, catalysts, and high temperature superconductors. In addition, we describe a number of related projects that are currently being carried out in the group, particularly those which utilise and develop novel STEM imaging and analytical techniques.

AB - The Microstructural Physics group at the Cavendish Laboratory is actively involved in a considerable number of research projects which cover a broad range of materials science. In this paper, we describe briefly several such projects, with particular emphasis given to the application of parallel-detection electron energy loss spectroscopy (PEELS) on a scanning transmission electron microscope (STEM) to the analysis of materials such as stainless steels, catalysts, and high temperature superconductors. In addition, we describe a number of related projects that are currently being carried out in the group, particularly those which utilise and develop novel STEM imaging and analytical techniques.

KW - HAADFI

KW - Nanolithography

KW - PEELS

KW - STEM

KW - STM

KW - Superresolution

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UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0027406571&origin=recordpage

U2 - 10.1002/jemt.1070240404

DO - 10.1002/jemt.1070240404

M3 - RGC 21 - Publication in refereed journal

C2 - 8390313

SN - 1059-910X

VL - 24

SP - 299

EP - 315

JO - Microscopy Research and Technique

JF - Microscopy Research and Technique

IS - 4

ER -

Microscopy in solid state science

Abstract

Research Keywords

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