Microscope Raman scattering and X-ray diffraction study of near-stoichiometric Ti: LiNbO 3 waveguides

De-Long Zhang; G. G. Siu; E. Y B Pun

doi:10.1002/pssa.200520083

Microscope Raman scattering and X-ray diffraction study of near-stoichiometric Ti: LiNbO ₃ waveguides

De-Long Zhang, G. G. Siu, E. Y B Pun

Department of Electrical Engineering

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

7 Citations (Scopus)

Abstract

The crystalline phase within guiding layers of near-stoichiometric strip and planar Ti: LiNbO ₃, waveguides, prepared by the method of simultaneous work of vapour transport equilibration (VTE) treatment and indiffusion of Ti film, was studied by combined confocal microscope Raman scattering and X-ray powder diffraction. The results show that the strip and planar waveguide layers still retain the LiNbO ₃ phase and no other non-LiNbO ₃ phases can be identified within the guiding layer. Li/Nb ratios inside and outside the strip and planar waveguide layers were determined from the microscope Raman scattering results and compared to those obtained from the measured optical absorption edge. It is shown that the Li/Nb ratios are homogeneous within the waveguide layer and are close inside and outside the waveguide layer. © 2005 WILEY-VCH Verlag GmbH & Co, KGaA, Weinheim.

Original language	English
Pages (from-to)	2521-2530
Journal	Physica Status Solidi (A) Applications and Materials Science
Volume	202
Issue number	13
DOIs	https://doi.org/10.1002/pssa.200520083
Publication status	Published - Oct 2005

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@article{32bbed567e6a4332bf86b0cb29fa3410,

title = "Microscope Raman scattering and X-ray diffraction study of near-stoichiometric Ti: LiNbO 3 waveguides",

abstract = "The crystalline phase within guiding layers of near-stoichiometric strip and planar Ti: LiNbO 3, waveguides, prepared by the method of simultaneous work of vapour transport equilibration (VTE) treatment and indiffusion of Ti film, was studied by combined confocal microscope Raman scattering and X-ray powder diffraction. The results show that the strip and planar waveguide layers still retain the LiNbO 3 phase and no other non-LiNbO 3 phases can be identified within the guiding layer. Li/Nb ratios inside and outside the strip and planar waveguide layers were determined from the microscope Raman scattering results and compared to those obtained from the measured optical absorption edge. It is shown that the Li/Nb ratios are homogeneous within the waveguide layer and are close inside and outside the waveguide layer. {\textcopyright} 2005 WILEY-VCH Verlag GmbH & Co, KGaA, Weinheim.",

author = "De-Long Zhang and Siu, {G. G.} and Pun, {E. Y B}",

year = "2005",

month = oct,

doi = "10.1002/pssa.200520083",

language = "English",

volume = "202",

pages = "2521--2530",

journal = "Physica Status Solidi (A) Applications and Materials Science",

issn = "1862-6300",

publisher = "Wiley-VCH Verlag GmbH",

number = "13",

}

TY - JOUR

T1 - Microscope Raman scattering and X-ray diffraction study of near-stoichiometric Ti

T2 - LiNbO 3 waveguides

AU - Zhang, De-Long

AU - Siu, G. G.

AU - Pun, E. Y B

PY - 2005/10

Y1 - 2005/10

N2 - The crystalline phase within guiding layers of near-stoichiometric strip and planar Ti: LiNbO 3, waveguides, prepared by the method of simultaneous work of vapour transport equilibration (VTE) treatment and indiffusion of Ti film, was studied by combined confocal microscope Raman scattering and X-ray powder diffraction. The results show that the strip and planar waveguide layers still retain the LiNbO 3 phase and no other non-LiNbO 3 phases can be identified within the guiding layer. Li/Nb ratios inside and outside the strip and planar waveguide layers were determined from the microscope Raman scattering results and compared to those obtained from the measured optical absorption edge. It is shown that the Li/Nb ratios are homogeneous within the waveguide layer and are close inside and outside the waveguide layer. © 2005 WILEY-VCH Verlag GmbH & Co, KGaA, Weinheim.

AB - The crystalline phase within guiding layers of near-stoichiometric strip and planar Ti: LiNbO 3, waveguides, prepared by the method of simultaneous work of vapour transport equilibration (VTE) treatment and indiffusion of Ti film, was studied by combined confocal microscope Raman scattering and X-ray powder diffraction. The results show that the strip and planar waveguide layers still retain the LiNbO 3 phase and no other non-LiNbO 3 phases can be identified within the guiding layer. Li/Nb ratios inside and outside the strip and planar waveguide layers were determined from the microscope Raman scattering results and compared to those obtained from the measured optical absorption edge. It is shown that the Li/Nb ratios are homogeneous within the waveguide layer and are close inside and outside the waveguide layer. © 2005 WILEY-VCH Verlag GmbH & Co, KGaA, Weinheim.

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U2 - 10.1002/pssa.200520083

DO - 10.1002/pssa.200520083

M3 - RGC 21 - Publication in refereed journal

SN - 1862-6300

VL - 202

SP - 2521

EP - 2530

JO - Physica Status Solidi (A) Applications and Materials Science

JF - Physica Status Solidi (A) Applications and Materials Science

IS - 13

ER -