Method for measurement of the density of thin films of small organic molecules

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Author(s)

  • Hai-Feng Xiang
  • Zong-Xiang Xu
  • V. A L Roy
  • Chi-Ming Che
  • P. T. Lai

Detail(s)

Original languageEnglish
Article number34104
Journal / PublicationReview of Scientific Instruments
Volume78
Issue number3
Publication statusPublished - 2007
Externally publishedYes

Abstract

An accurate and sensitive method is reported to measure the thin-film density of vacuum-deposited, small-molecular organic semiconductor materials. A spectrophotometer and surface profiler had been used to determine the mass and thickness of organic thin film, respectively. The calculated density of tris-(8-hydroxyquinolato) aluminum (Alq3) thin film was 1.31±0.01 g/cm3. Vacuum pressures and thin-film growth rates are found to have less impact on the thin-film density of organic material. However, the thin-film density of organic material strongly depends on its chemical structure and molecular weight. Specifically, the chemical structure determines the density of organic material that affects the molecular volume and intermolecular stacking. © 2007 American Institute of Physics.

Citation Format(s)

Method for measurement of the density of thin films of small organic molecules. / Xiang, Hai-Feng; Xu, Zong-Xiang; Roy, V. A L; Che, Chi-Ming; Lai, P. T.

In: Review of Scientific Instruments, Vol. 78, No. 3, 34104, 2007.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review