Mechanical response of polar/non-polar ZnO under low dimensional stress

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journal

6 Scopus Citations
View graph of relations

Author(s)

Detail(s)

Original languageEnglish
Article number241901
Journal / PublicationApplied Physics Letters
Volume102
Issue number24
Online published17 Jun 2013
Publication statusPublished - 17 Jun 2013
Externally publishedYes

Abstract

The mechanical properties of high quality polar (c-plane) and non-polar (a-plane and m-plane) ZnO wafers were examined by using nanoindentation and microcompression testing. The nano-scaled modulus, hardness, and yield strength readings of the c-plane, a-plane and m-plane ZnO wafers determined by nanoindentation are 140, 159, and 161; 7.1, 3.9, and 4.0; and 12.0, 6.7, and 4.5 GPa, respectively. The micro-scaled data directly measured by microcompression are much lower than the nano-scaled data. The cathodoluminescence images are in consistence with the slip systems observed from the transmission electron microscopy characterization.