Measuring depths of sub-micron tracks in a CR-39 detector from replicas using Atomic Force Microscopy

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Author(s)

Detail(s)

Original languageEnglish
Pages (from-to)380-383
Journal / PublicationRadiation Measurements
Volume40
Issue number2-6
Publication statusPublished - Nov 2005

Conference

Title22nd International Conference on Nuclear Tracks in Soils (ICNTS 22)
LocationUniversitat Autònoma de Barcelona
PlaceSpain
CityBarcelona
Period23 - 27 August 2004

Abstract

One of the challenging tasks in the application of solid-state nuclear track detectors (SSNTDs) is the measurement of the depth of the tracks, in particular, the shallow ones resulting from short etching periods. In the present work, a method is proposed to prepare replicas of tracks from α particles in the CR-39 SSNTDs and to measure their heights using atomic force microscopy (AFM). After irradiation, the detectors were etched in a 6.25 N aqueous solution of NaOH maintained at 70 °C. The etched detectors were immersed into a beaker of the replicating fluid, which was placed in a water bath under ultrasonic vibration and maintained at room temperature to facilitate the filling of the etched tracks with the replicating fluid. As an example of application, these results have been used to derive a V function for the CR-39 detectors used in the present study (for the specified etching conditions). © 2005 Elsevier Ltd. All rights reserved.

Research Area(s)

  • Atomic force microscopy, CR-39, Replica, Track length