TY - JOUR
T1 - Measurement of optical mirror with a small-aperture interferometer
AU - Gao, Ya
AU - Tam, Hon Yuen
AU - Wen, Yongfu
AU - Zhang, Huijing
AU - Cheng, Haobo
PY - 2012
Y1 - 2012
N2 - In this paper, the principle of subaperture stitching interferometry was introduced. A testing stage with five degrees of freedom for stitching interferometry was built. A model based on least-squares method and error averaging method for data processing was established, which could reduce error accumulation and improve the precision. A 100 mm plane mirror was measured with a 50 mm aperture interferometer by means of stitching interferometry. Compared with the results by a 100 mm interferometer, peak to valley (PV) and root mean square (RMS) of the phase distribution residual are 0:0038λ and 0:0004λ, respectively. It proved that the model and method are helpful for large optical measurement. © 2012 Higher Education Press and Springer-Verlag Berlin Heidelberg.
AB - In this paper, the principle of subaperture stitching interferometry was introduced. A testing stage with five degrees of freedom for stitching interferometry was built. A model based on least-squares method and error averaging method for data processing was established, which could reduce error accumulation and improve the precision. A 100 mm plane mirror was measured with a 50 mm aperture interferometer by means of stitching interferometry. Compared with the results by a 100 mm interferometer, peak to valley (PV) and root mean square (RMS) of the phase distribution residual are 0:0038λ and 0:0004λ, respectively. It proved that the model and method are helpful for large optical measurement. © 2012 Higher Education Press and Springer-Verlag Berlin Heidelberg.
KW - interferometry
KW - residual error
KW - subaperture stitching
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U2 - 10.1007/s12200-012-0233-6
DO - 10.1007/s12200-012-0233-6
M3 - RGC 21 - Publication in refereed journal
SN - 2095-2759
VL - 5
SP - 218
EP - 223
JO - Frontiers of Optoelectronics
JF - Frontiers of Optoelectronics
IS - 2
ER -