TY - GEN
T1 - Market risk for nonferrous metals
T2 - ISDA 2006: Sixth International Conference on Intelligent Systems Design and Applications
AU - Lai, Kin Keung
AU - He, Kaijian
AU - Xie, Chi
AU - Chen, Shou
PY - 2006
Y1 - 2006
N2 - With the rapid development of the global economy in the last two decades have come intensified price fluctuations in the metals markets due to uneven product distribution and inadequate productivity. Risk management techniques such as Value at Risk (VaR) have been demanded and have increasingly become the basis of planning for the nonferrous metal industry. As the traditional ex-post approaches to VaR estimates, such as the ARMA-GARCH model, leave little room for further performance improvement, this paper proposes the ex-ante based approach to VaR estimates and introduces the wavelet theory to strike the balance between the needs of data characteristics categorization and model calibrations. Empirical studies in four nonferrous metals markets show that WDVaR can significantly improve performance, compared to the existing ARMA-GARCH models, besides facilitating greater flexibility in tuning models for a specific market under investigation. © 2006 IEEE.
AB - With the rapid development of the global economy in the last two decades have come intensified price fluctuations in the metals markets due to uneven product distribution and inadequate productivity. Risk management techniques such as Value at Risk (VaR) have been demanded and have increasingly become the basis of planning for the nonferrous metal industry. As the traditional ex-post approaches to VaR estimates, such as the ARMA-GARCH model, leave little room for further performance improvement, this paper proposes the ex-ante based approach to VaR estimates and introduces the wavelet theory to strike the balance between the needs of data characteristics categorization and model calibrations. Empirical studies in four nonferrous metals markets show that WDVaR can significantly improve performance, compared to the existing ARMA-GARCH models, besides facilitating greater flexibility in tuning models for a specific market under investigation. © 2006 IEEE.
UR - http://www.scopus.com/inward/record.url?scp=34547515742&partnerID=8YFLogxK
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-34547515742&origin=recordpage
U2 - 10.1109/ISDA.2006.191
DO - 10.1109/ISDA.2006.191
M3 - RGC 32 - Refereed conference paper (with host publication)
SN - 0769525288
SN - 9780769525280
VL - 1
SP - 1179
EP - 1184
BT - Proceedings - ISDA 2006: Sixth International Conference on Intelligent Systems Design and Applications
Y2 - 16 October 2006 through 18 October 2006
ER -