Mapping plasmonic near-field profiles and interferences by surface-enhanced Raman scattering

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

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Author(s)

  • Luping Du
  • Guanghui Yuan
  • Hui Fang
  • Xi Zhang
  • Qian Wang
  • Dingyuan Tang
  • Changjun Min
  • Stefan A. Maier
  • Xiaocong Yuan

Detail(s)

Original languageEnglish
Article number3064
Journal / PublicationScientific Reports
Volume3
Early online date29 Oct 2013
Publication statusPublished - 2013
Externally publishedYes

Abstract

Mapping near-field profiles and dynamics of surface plasmon polaritons is crucial for understanding their fundamental optical properties and designing miniaturized photonic devices. This requires a spatial resolution on the sub-wavelength scale because the effective polariton wavelength is shorter than free-space excitation wavelengths. Here by combining total internal reflection excitation with surface-enhanced Raman scattering imaging, we mapped at the sub-wavelength scale the spatial distribution of the dominant perpendicular component of surface plasmon fields in a metal nanoparticle-film system through spectrally selective and polarization-resolved excitation of the vertical gap mode. The lateral field-extension at the junction, which is determined by the gap-mode volume, is small enough to distinguish a spot size ∼0.355λ 0 generated by a focused radially polarized beam with high reproducibility. The same excitation and imaging schemes are also used to trace near-field nano-focusing and interferences of surface plasmon polaritons created by a variety of plasmon lenses.

Citation Format(s)

Mapping plasmonic near-field profiles and interferences by surface-enhanced Raman scattering. / Du, Luping; Lei, Dang Yuan; Yuan, Guanghui; Fang, Hui; Zhang, Xi; Wang, Qian; Tang, Dingyuan; Min, Changjun; Maier, Stefan A.; Yuan, Xiaocong.

In: Scientific Reports, Vol. 3, 3064, 2013.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review