Magnetism as a probe of the origin of memristive switching in p-type antiferromagnetic NiO

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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Author(s)

  • P. S. Ku
  • Q. Shao
  • W. F. Cheng
  • C. W. Leung

Detail(s)

Original languageEnglish
Article number223508
Journal / PublicationApplied Physics Letters
Volume103
Issue number22
Online published25 Nov 2013
Publication statusPublished - 25 Nov 2013

Link(s)

Abstract

We induced bipolar resistive switching in p-type nickel oxide. By probing the magnetic properties of the films, we proved that bipolar resistive switching in this antiferromagnetic oxide was due to the formation and rupture of oxygen-vacancy filaments, rather than electrochemical growth and dissolution of nickel-ion filaments. In the low resistive state, oxygen-mediated super-exchange interaction was suppressed along the conductive paths. This led to a reduction of the saturation moment but not the appearance of a ferromagnetic phase, excluding the formation of nickel filaments. © 2013 AIP Publishing LLC.

Research Area(s)

Citation Format(s)

Magnetism as a probe of the origin of memristive switching in p-type antiferromagnetic NiO. / Wang, X. L.; Ku, P. S.; Shao, Q. et al.
In: Applied Physics Letters, Vol. 103, No. 22, 223508, 25.11.2013.

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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