Magnetism as a probe of the origin of memristive switching in p-type antiferromagnetic NiO
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Article number | 223508 |
Journal / Publication | Applied Physics Letters |
Volume | 103 |
Issue number | 22 |
Online published | 25 Nov 2013 |
Publication status | Published - 25 Nov 2013 |
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DOI | DOI |
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Attachment(s) | Documents
Publisher's Copyright Statement
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Link to Scopus | https://www.scopus.com/record/display.uri?eid=2-s2.0-84888618130&origin=recordpage |
Permanent Link | https://scholars.cityu.edu.hk/en/publications/publication(e022376c-6ffd-4175-80e2-e523f782d3bd).html |
Abstract
We induced bipolar resistive switching in p-type nickel oxide. By probing the magnetic properties of the films, we proved that bipolar resistive switching in this antiferromagnetic oxide was due to the formation and rupture of oxygen-vacancy filaments, rather than electrochemical growth and dissolution of nickel-ion filaments. In the low resistive state, oxygen-mediated super-exchange interaction was suppressed along the conductive paths. This led to a reduction of the saturation moment but not the appearance of a ferromagnetic phase, excluding the formation of nickel filaments. © 2013 AIP Publishing LLC.
Research Area(s)
Citation Format(s)
Magnetism as a probe of the origin of memristive switching in p-type antiferromagnetic NiO. / Wang, X. L.; Ku, P. S.; Shao, Q. et al.
In: Applied Physics Letters, Vol. 103, No. 22, 223508, 25.11.2013.
In: Applied Physics Letters, Vol. 103, No. 22, 223508, 25.11.2013.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
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