Magnetic fingerprint of interfacial coupling between CoFe and nanoscale ferroelectric domain walls

Qintong Zhang; Peyton Murray; Lu You; Caihua Wan; Xuan Zhang; Wenjing Li; Usman Khan; Junling Wang; Kai Liu; Xiufeng Han

doi:10.1063/1.4961545

Magnetic fingerprint of interfacial coupling between CoFe and nanoscale ferroelectric domain walls

Qintong Zhang
, Peyton Murray
, Lu You
, Caihua Wan
, Xuan Zhang
, Wenjing Li
, Usman Khan
, Junling Wang
, Kai Liu
, Xiufeng Han

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

2 Citations (Scopus)

Abstract

Magnetoelectric coupling in ferromagnetic/multiferroic systems is often manifested in the exchange bias effect, which may have combined contributions from multiple sources, such as domain walls, chemical defects, or strain. In this study we magnetically "fingerprint" the coupling behavior of CoFe grown on epitaxial BiFeO₃ (BFO) thin films by magnetometry and the first-order-reversal-curves (FORC). The contribution to exchange bias from 71°, 109° and charged ferroelectric domain walls (DWs) was elucidated by the FORC distribution. CoFe samples grown on BFO with 71° DWs only exhibit an enhancement of the coercivity, but little exchange bias. Samples grown on BFO with 109° DWs and mosaic DWs exhibit a much larger exchange bias, with the main enhancement attributed to 109° and charged DWs. Based on the Malozemoff random field model, a varying-anisotropy model is proposed to account for the exchange bias enhancement. This work sheds light on the relationship between the exchange bias effect of the CoFe/BFO heterointerface and the ferroelectric DWs, and provides a path for multiferroic device analysis and design. © 2016 Author(s).

Original language	English
Article number	082906
Journal	Applied Physics Letters
Volume	109
Issue number	8
DOIs	https://doi.org/10.1063/1.4961545
Publication status	Published - 22 Aug 2016
Externally published	Yes

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Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

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@article{0f428fefaffa4c54a02b23efb63bd65d,

title = "Magnetic fingerprint of interfacial coupling between CoFe and nanoscale ferroelectric domain walls",

abstract = "Magnetoelectric coupling in ferromagnetic/multiferroic systems is often manifested in the exchange bias effect, which may have combined contributions from multiple sources, such as domain walls, chemical defects, or strain. In this study we magnetically {"}fingerprint{"} the coupling behavior of CoFe grown on epitaxial BiFeO3 (BFO) thin films by magnetometry and the first-order-reversal-curves (FORC). The contribution to exchange bias from 71°, 109° and charged ferroelectric domain walls (DWs) was elucidated by the FORC distribution. CoFe samples grown on BFO with 71° DWs only exhibit an enhancement of the coercivity, but little exchange bias. Samples grown on BFO with 109° DWs and mosaic DWs exhibit a much larger exchange bias, with the main enhancement attributed to 109° and charged DWs. Based on the Malozemoff random field model, a varying-anisotropy model is proposed to account for the exchange bias enhancement. This work sheds light on the relationship between the exchange bias effect of the CoFe/BFO heterointerface and the ferroelectric DWs, and provides a path for multiferroic device analysis and design. {\textcopyright} 2016 Author(s).",

author = "Qintong Zhang and Peyton Murray and Lu You and Caihua Wan and Xuan Zhang and Wenjing Li and Usman Khan and Junling Wang and Kai Liu and Xiufeng Han",

note = "Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].",

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doi = "10.1063/1.4961545",

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TY - JOUR

T1 - Magnetic fingerprint of interfacial coupling between CoFe and nanoscale ferroelectric domain walls

AU - Zhang, Qintong

AU - Murray, Peyton

AU - You, Lu

AU - Wan, Caihua

AU - Zhang, Xuan

AU - Li, Wenjing

AU - Khan, Usman

AU - Wang, Junling

AU - Liu, Kai

AU - Han, Xiufeng

N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

PY - 2016/8/22

Y1 - 2016/8/22

N2 - Magnetoelectric coupling in ferromagnetic/multiferroic systems is often manifested in the exchange bias effect, which may have combined contributions from multiple sources, such as domain walls, chemical defects, or strain. In this study we magnetically "fingerprint" the coupling behavior of CoFe grown on epitaxial BiFeO3 (BFO) thin films by magnetometry and the first-order-reversal-curves (FORC). The contribution to exchange bias from 71°, 109° and charged ferroelectric domain walls (DWs) was elucidated by the FORC distribution. CoFe samples grown on BFO with 71° DWs only exhibit an enhancement of the coercivity, but little exchange bias. Samples grown on BFO with 109° DWs and mosaic DWs exhibit a much larger exchange bias, with the main enhancement attributed to 109° and charged DWs. Based on the Malozemoff random field model, a varying-anisotropy model is proposed to account for the exchange bias enhancement. This work sheds light on the relationship between the exchange bias effect of the CoFe/BFO heterointerface and the ferroelectric DWs, and provides a path for multiferroic device analysis and design. © 2016 Author(s).

AB - Magnetoelectric coupling in ferromagnetic/multiferroic systems is often manifested in the exchange bias effect, which may have combined contributions from multiple sources, such as domain walls, chemical defects, or strain. In this study we magnetically "fingerprint" the coupling behavior of CoFe grown on epitaxial BiFeO3 (BFO) thin films by magnetometry and the first-order-reversal-curves (FORC). The contribution to exchange bias from 71°, 109° and charged ferroelectric domain walls (DWs) was elucidated by the FORC distribution. CoFe samples grown on BFO with 71° DWs only exhibit an enhancement of the coercivity, but little exchange bias. Samples grown on BFO with 109° DWs and mosaic DWs exhibit a much larger exchange bias, with the main enhancement attributed to 109° and charged DWs. Based on the Malozemoff random field model, a varying-anisotropy model is proposed to account for the exchange bias enhancement. This work sheds light on the relationship between the exchange bias effect of the CoFe/BFO heterointerface and the ferroelectric DWs, and provides a path for multiferroic device analysis and design. © 2016 Author(s).

UR - https://www.scopus.com/pages/publications/84984694271

UR - https://www.scopus.com/pages/publications/84984694271#tab=impact

U2 - 10.1063/1.4961545

DO - 10.1063/1.4961545

M3 - RGC 21 - Publication in refereed journal

SN - 0003-6951

VL - 109

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 8

M1 - 082906

ER -

Magnetic fingerprint of interfacial coupling between CoFe and nanoscale ferroelectric domain walls

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