Magnetic fingerprint of interfacial coupling between CoFe and nanoscale ferroelectric domain walls

Qintong Zhang, Peyton Murray, Lu You, Caihua Wan, Xuan Zhang, Wenjing Li, Usman Khan, Junling Wang, Kai Liu, Xiufeng Han

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

1 Citation (Scopus)

Abstract

Magnetoelectric coupling in ferromagnetic/multiferroic systems is often manifested in the exchange bias effect, which may have combined contributions from multiple sources, such as domain walls, chemical defects, or strain. In this study we magnetically "fingerprint" the coupling behavior of CoFe grown on epitaxial BiFeO3 (BFO) thin films by magnetometry and the first-order-reversal-curves (FORC). The contribution to exchange bias from 71°, 109° and charged ferroelectric domain walls (DWs) was elucidated by the FORC distribution. CoFe samples grown on BFO with 71° DWs only exhibit an enhancement of the coercivity, but little exchange bias. Samples grown on BFO with 109° DWs and mosaic DWs exhibit a much larger exchange bias, with the main enhancement attributed to 109° and charged DWs. Based on the Malozemoff random field model, a varying-anisotropy model is proposed to account for the exchange bias enhancement. This work sheds light on the relationship between the exchange bias effect of the CoFe/BFO heterointerface and the ferroelectric DWs, and provides a path for multiferroic device analysis and design. © 2016 Author(s).
Original languageEnglish
Article number082906
JournalApplied Physics Letters
Volume109
Issue number8
DOIs
Publication statusPublished - 22 Aug 2016
Externally publishedYes

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