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Machine-learning-enhanced time-of-flight mass spectrometry analysis

Ye Wei*, Rama Srinivas Varanasi, Torsten Schwarz, Leonie Gomell, Huan Zhao, David J. Larson, Binhan Sun, Geng Liu, Hao Chen, Dierk Raabe, Baptiste Gault*

*Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

19 Downloads (CityUHK Scholars)

Abstract

Mass spectrometry is a widespread approach used to work out what the constituents of a material are. Atoms and molecules are removed from the material and collected, and subsequently, a critical step is to infer their correct identities based on patterns formed in their mass-to-charge ratios and relative isotopic abundances. However, this identification step still mainly relies on individual users' expertise, making its standardization challenging, and hindering efficient data processing. Here, we introduce an approach that leverages modern machine learning technique to identify peak patterns in time-of-flight mass spectra within microseconds, outperforming human users without loss of accuracy. Our approach is cross-validated on mass spectra generated from different time-of-flight mass spectrometry (ToF-MS) techniques, offering the ToF-MS community an open-source, intelligent mass spectra analysis. Time-of-flight mass spectrometry (ToF-MS) is a mainstream analytical technique widely used in biology, chemistry, and materials science. ToF-MS provides quantitative compositional analysis with high sensitivity across a wide dynamic range of mass-to-charge ratios. A critical step in ToF-MS is to infer the identity of the detected ions. Here, we introduce a machine-learning-enhanced algorithm to provide a user-independent approach to performing this identification using patterns from the natural isotopic abundances of individual atomic and molecular ions, without human labeling or prior knowledge of composition. Results from several materials and techniques are compared with those obtained by field experts. Our open-source, easy-to-implement, reliable analytic method accelerates this identification process. A wide range of ToF-MS-based applications can benefit from our approach, e.g., hunting for patterns of biomarkers or for contamination on solid surfaces in high-throughput data. A machine-learning application for the accelerated data processing and interpretation of time-of-flight mass spectrometry is presented. The machine learns patterns in a human-label-free manner, making the process easy to implement and the result highly reproducible. © 2020 The Authors.
Original languageEnglish
Article number100192
JournalPatterns
Volume2
Issue number2
Online published21 Jan 2021
DOIs
Publication statusPublished - 12 Feb 2021
Externally publishedYes

Research Keywords

  • atom probe tomography
  • DSML 3: Development/Pre-production: Data science output has been rolled out/validated across multiple domains/problems
  • machine learning
  • pattern recognition
  • secondary ion mass spectrometry
  • time-of-flight mass spectrometry

Publisher's Copyright Statement

  • This full text is made available under CC-BY-NC-ND 4.0. https://creativecommons.org/licenses/by-nc-nd/4.0/

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