Abstract
Ultrahigh-resolution transmission electron microscopy clearly reveals the absence of a disordered or softer interface layer between GexSi 1-x nanocrystals (NCs) and the SiO2 matrix. A theory shows that the collective modes comprising coherent excitation of phonons in a large number of NCs contribute to the Raman scattering. This work provides a new understanding of low-frequency Raman scattering from NC-embedded matrices.
| Original language | English |
|---|---|
| Pages (from-to) | 2823-2826 |
| Journal | Small |
| Volume | 5 |
| Issue number | 24 |
| DOIs | |
| Publication status | Published - 18 Dec 2009 |
Research Keywords
- Coherent excitation
- Nanocrystals
- Raman spectroscopy
- Surface vibrations
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