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Low-frequency Raman scattering from nanocrystals caused by coherent excitation of phonons

  • X. L. Wu
  • , S. J. Xiong
  • , L. T. Sun
  • , J. C. Shen
  • , Paul K. Chu

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Abstract

    Ultrahigh-resolution transmission electron microscopy clearly reveals the absence of a disordered or softer interface layer between GexSi 1-x nanocrystals (NCs) and the SiO2 matrix. A theory shows that the collective modes comprising coherent excitation of phonons in a large number of NCs contribute to the Raman scattering. This work provides a new understanding of low-frequency Raman scattering from NC-embedded matrices.
    Original languageEnglish
    Pages (from-to)2823-2826
    JournalSmall
    Volume5
    Issue number24
    DOIs
    Publication statusPublished - 18 Dec 2009

    Research Keywords

    • Coherent excitation
    • Nanocrystals
    • Raman spectroscopy
    • Surface vibrations

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