Abstract
In recent years, machine learning (ML) and deep learning (DL) have been widely used to break the metasurface’s performance ceiling. However, the existing data-driven ML and DL methods usually require the availability of vast amounts of training data to ensure their stable and accurate performance. The process of acquiring these data is high-cost due to the need for numerous full-wave electromagnetic (EM) simulations. Here, we propose a low-cost surrogate model to generate these data efficiently. The proposed model employs microwave network theory to separate meta-elements into four independent components. Through integration with transmission line theory, we derive the EM responses of meta-elements using analytical representation with the active device equivalent impedance and dielectric as design variables. Two typical phase-modulation active meta-elements are employed to verify the accuracy of our macromodel in comparison with full-wave EM simulations. Based on the developed macromodel, the superior prediction ability is further presented to illustrate the performance of meta-elements with various active devices and dielectric substrates. The proposed macromodel is a feasible and general method to rapidly obtain the necessary training data of active meta-elements, which holds a great potential to significantly reduce the designing time of ML and DL models for the active metasurfaces. © 2024 Wiley-VCH GmbH.
| Original language | English |
|---|---|
| Article number | 2400850 |
| Number of pages | 13 |
| Journal | Advanced Materials Technologies |
| Volume | 10 |
| Issue number | 4 |
| Online published | 3 Sept 2024 |
| DOIs | |
| Publication status | Published - 19 Feb 2025 |
Research Keywords
- data generation
- low-cost model
- microwave network theory
- reconfigurable metasurfaces
- surrogate model
Fingerprint
Dive into the research topics of 'Low-Cost Surrogate Modeling for Expedited Data Acquisition of Reconfigurable Metasurfaces'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver