TY - JOUR
T1 - Locally er-doped near-stoichiometric LiNbO3 Crystals prepared by standard er diffusion and post-VTE treatment
AU - Zhang, De-Long
AU - Wang, Yi-Peng
AU - Hua, Ping-Rang
AU - Jia, Qi-Shen
AU - Liu, Hong-Li
AU - Cui, Yu-Ming
AU - Pun, Edwin Yue-Bun
PY - 2009/8
Y1 - 2009/8
N2 - The feasibility of preparing locally Er-doped near-stoichiometric (NS) LiNbO3 crystals for integrated optics applications is demonstrated by a two-step process with standard diffusion (1130°C/154 h) of Er metal followed by vapor transport equilibration (VTE) treatment under three different conditions of 1135°C/22 h, 1115°C/50 h, and 1125°C/60 h. Detailed studies on the crystalline phase, Li composition, diffused surface roughness, and emission characteristics of Er3+ ions indicate that there is an upper limit on the initial Er metal film thickness: ∼20 nm for an X-cut crystal and ∼30 nm for a Z-cut crystal. When the initial Er film thickness is below this limit, the post-VTE does not induce formation of ErNbO4 precipitate and the diffused surface retains high quality with a root mean square roughness - content in crystal, slight lengthening of lifetime and slight narrowing of linewidth of Er3+ emission at 1530 nm. © 2009 The American Ceramic Society.
AB - The feasibility of preparing locally Er-doped near-stoichiometric (NS) LiNbO3 crystals for integrated optics applications is demonstrated by a two-step process with standard diffusion (1130°C/154 h) of Er metal followed by vapor transport equilibration (VTE) treatment under three different conditions of 1135°C/22 h, 1115°C/50 h, and 1125°C/60 h. Detailed studies on the crystalline phase, Li composition, diffused surface roughness, and emission characteristics of Er3+ ions indicate that there is an upper limit on the initial Er metal film thickness: ∼20 nm for an X-cut crystal and ∼30 nm for a Z-cut crystal. When the initial Er film thickness is below this limit, the post-VTE does not induce formation of ErNbO4 precipitate and the diffused surface retains high quality with a root mean square roughness - content in crystal, slight lengthening of lifetime and slight narrowing of linewidth of Er3+ emission at 1530 nm. © 2009 The American Ceramic Society.
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U2 - 10.1111/j.1551-2916.2009.03129.x
DO - 10.1111/j.1551-2916.2009.03129.x
M3 - RGC 21 - Publication in refereed journal
SN - 0002-7820
VL - 92
SP - 1739
EP - 1747
JO - Journal of the American Ceramic Society
JF - Journal of the American Ceramic Society
IS - 8
ER -