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Local strain in interface: Origin of grain tilting in diamond (001)/silicon (001) heteroepitaxy

X. Jiang, R. Q. Zhang, G. Yu, S. T. Lee

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    43 Downloads (CityUHK Scholars)

    Abstract

    Diamond grain tilting, one of the central problems of diamond heteroepitaxy on silicon (001) surface, has been studied by means of atomic-force and high-resolution electron microscopic observations, and by theoretical simulation using the molecular-orbital method. It is shown that, due to interface mismatch-induced local lattice strain and three-dimensional stacking, diamond nucleation in small areas results naturally in grain tilting. For more perfect heteroepitaxy, nucleation with reduced silicon surface damage and over relatively large lateral domains is required.
    Original languageEnglish
    Pages (from-to)15351-15354
    JournalPhysical Review B - Condensed Matter and Materials Physics
    Volume58
    Issue number23
    DOIs
    Publication statusPublished - 15 Dec 1998

    Publisher's Copyright Statement

    • COPYRIGHT TERMS OF DEPOSITED FINAL PUBLISHED VERSION FILE: Jiang, X., Zhang, R. Q., Yu, G., & Lee, S. T. (1998). Local strain in interface: Origin of grain tilting in diamond (001)/silicon (001) heteroepitaxy. Physical Review B - Condensed Matter and Materials Physics, 58(23), 15351-15354. https://doi.org/10.1103/PhysRevB.58.15351. The copyright of this article is owned by American Physical Society.

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