Abstract
Growth kinetics and interfacial morphologies of the intermetallic compound (IMCs) between Sn-3Ag-0.5CuxFe( 0, 0.5wt.%, 1wt.%) composite solders and Cu substrates were investigated by reflowing for different durations at 250°C. Fe particles were deposited quickly in the vicinity of IMCs of the as-reflow samples due to the higher density of Fe than that of Sn-Ag-Cu. They formed a region about 30μm wide where the volume percentage of Fe particles could reach 19%. The isothermal equation of chemical reaction and phase diagrams is used to explain the effect of Fe on the growth kinetics of IMCs under liquid-state conditions. It is found that Fe can effectively retard the growth of Cu6Sn5 and Cu3Sn during liquid-state aging and reduce the size of Cu6Sn5 particles. Some local small cracks were observed in the Cu6Sn5 particles near interfaces of SAC solder alloys after reflowing for about five minutes. Such cracks were found in the other composite solders only thirty minutes reflow. ©2009 IEEE.
| Original language | English |
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| Title of host publication | 2009 International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2009 |
| Pages | 687-690 |
| DOIs | |
| Publication status | Published - 2009 |
| Event | 2009 International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2009 - Beijing, China Duration: 10 Aug 2009 → 13 Aug 2009 |
Conference
| Conference | 2009 International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2009 |
|---|---|
| Place | China |
| City | Beijing |
| Period | 10/08/09 → 13/08/09 |
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