LEIS for structure determination of surfaces and thin films

B. V. King; D. J. O'Connor; Y. Shen; R. J. MacDonald; M. Katayama; M. Aono

doi:10.1016/0169-4332(91)90338-K

LEIS for structure determination of surfaces and thin films

B. V. King
, D. J. O'Connor
, Y. Shen
, R. J. MacDonald
, M. Katayama
, M. Aono

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

3 Citations (Scopus)

Abstract

Ion scattering spectrometry (ISS) has developed as a useful method of analysing the structure of single-crystal surfaces. In this paper, the strengths and weaknesses of four techniques of low-energy ion scattering (LEIS) are discussed in reference to the analysis of c(2 × 2)O/Ni(001), (2 × 1)O/Ni(110) and CaF₂/Si(111). The techniques are LENRS (low-energy negative recoil spectrometry), CAICISS (coaxial impact ion scattering spectrometry) and conventional LEIS using inert gas and alkali ions. © 1991.

Original language	English
Pages (from-to)	246-253
Journal	Applied Surface Science
Volume	48-49
Issue number	C
DOIs	https://doi.org/10.1016/0169-4332(91)90338-K
Publication status	Published - 1991
Externally published	Yes

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@article{03a6bbc540c6440fba4d9c16cb277c89,

title = "LEIS for structure determination of surfaces and thin films",

abstract = "Ion scattering spectrometry (ISS) has developed as a useful method of analysing the structure of single-crystal surfaces. In this paper, the strengths and weaknesses of four techniques of low-energy ion scattering (LEIS) are discussed in reference to the analysis of c(2 × 2)O/Ni(001), (2 × 1)O/Ni(110) and CaF2/Si(111). The techniques are LENRS (low-energy negative recoil spectrometry), CAICISS (coaxial impact ion scattering spectrometry) and conventional LEIS using inert gas and alkali ions. {\textcopyright} 1991.",

author = "King, \{B. V.\} and O'Connor, \{D. J.\} and Y. Shen and MacDonald, \{R. J.\} and M. Katayama and M. Aono",

year = "1991",

doi = "10.1016/0169-4332(91)90338-K",

language = "English",

volume = "48-49",

pages = "246--253",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier B.V.",

number = "C",

}

TY - JOUR

T1 - LEIS for structure determination of surfaces and thin films

AU - King, B. V.

AU - O'Connor, D. J.

AU - Shen, Y.

AU - MacDonald, R. J.

AU - Katayama, M.

AU - Aono, M.

PY - 1991

Y1 - 1991

N2 - Ion scattering spectrometry (ISS) has developed as a useful method of analysing the structure of single-crystal surfaces. In this paper, the strengths and weaknesses of four techniques of low-energy ion scattering (LEIS) are discussed in reference to the analysis of c(2 × 2)O/Ni(001), (2 × 1)O/Ni(110) and CaF2/Si(111). The techniques are LENRS (low-energy negative recoil spectrometry), CAICISS (coaxial impact ion scattering spectrometry) and conventional LEIS using inert gas and alkali ions. © 1991.

AB - Ion scattering spectrometry (ISS) has developed as a useful method of analysing the structure of single-crystal surfaces. In this paper, the strengths and weaknesses of four techniques of low-energy ion scattering (LEIS) are discussed in reference to the analysis of c(2 × 2)O/Ni(001), (2 × 1)O/Ni(110) and CaF2/Si(111). The techniques are LENRS (low-energy negative recoil spectrometry), CAICISS (coaxial impact ion scattering spectrometry) and conventional LEIS using inert gas and alkali ions. © 1991.

UR - https://www.scopus.com/pages/publications/0026154695

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0026154695&origin=recordpage

U2 - 10.1016/0169-4332(91)90338-K

DO - 10.1016/0169-4332(91)90338-K

M3 - RGC 21 - Publication in refereed journal

SN - 0169-4332

VL - 48-49

SP - 246

EP - 253

JO - Applied Surface Science

JF - Applied Surface Science

IS - C

ER -

LEIS for structure determination of surfaces and thin films

Abstract

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