LEIS for structure determination of surfaces and thin films

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

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Author(s)

  • B. V. King
  • D. J. O'Connor
  • R. J. MacDonald
  • M. Katayama
  • M. Aono

Detail(s)

Original languageEnglish
Pages (from-to)246-253
Journal / PublicationApplied Surface Science
Volume48-49
Issue numberC
Publication statusPublished - 1991
Externally publishedYes

Link(s)

DOI

DOI
Check@CityULib
Link to Scopus https://www.scopus.com/record/display.uri?eid=2-s2.0-0026154695&origin=recordpage
Permanent Link https://scholars.cityu.edu.hk/en/publications/publication(03a6bbc5-40c6-440f-ba4d-9c16cb277c89).html

Abstract

Ion scattering spectrometry (ISS) has developed as a useful method of analysing the structure of single-crystal surfaces. In this paper, the strengths and weaknesses of four techniques of low-energy ion scattering (LEIS) are discussed in reference to the analysis of c(2 × 2)O/Ni(001), (2 × 1)O/Ni(110) and CaF2/Si(111). The techniques are LENRS (low-energy negative recoil spectrometry), CAICISS (coaxial impact ion scattering spectrometry) and conventional LEIS using inert gas and alkali ions. © 1991.

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Publication fingerprints text

100
Low Energy Ion Scat... Keyphrases
100
Structure Determina... Keyphrases
100
Spectrometry Keyphrases
100
surfaces INIS
100
energy INIS
100
thin films INIS
100
ions INIS
100
scattering INIS
100
Ion Scattering Physics
100
Thin Films Physics
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Citation Format(s)

[ RIS ] [ BibTeX ]
LEIS for structure determination of surfaces and thin films. / King, B. V.; O'Connor, D. J.; Shen, Y. et al.
In: Applied Surface Science, Vol. 48-49, No. C, 1991, p. 246-253.

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review