Layer Spacings in Coherently Strained Epitaxial Metal Films

W. F. Chung; Y. J. Feng; H. C. Poon; C. T. Chan; S. Y. Tong; M. S. Altman

doi:10.1103/PhysRevLett.90.216105

Layer Spacings in Coherently Strained Epitaxial Metal Films

W. F. Chung
, Y. J. Feng
, H. C. Poon
, C. T. Chan
, S. Y. Tong
, M. S. Altman

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

1 Citation (Scopus)

Abstract

Laterally resolved measurements of the quantum size effect (QSE) in electron reflectivity are made with low energy electron microscopy on coherently strained Ag films on a W(110) surface. The evolution of the total film thickness with increasing number of atomic layers is determined accurately by dynamical theory analysis of the QSE features. Combined with a model of layer spacings obtained from first-principles calculations, this provides for a novel approach to determine the buried interface layer spacing, which is inaccessible to other methods. © 2003 The American Physical Society.

Original language	English
Journal	Physical Review Letters
Volume	90
Issue number	21
DOIs	https://doi.org/10.1103/PhysRevLett.90.216105
Publication status	Published - 2003
Externally published	Yes

Bibliographical note

Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

Funding

This work was supported by the Hong Kong Research Grants Council under Grants No. HKUST6129/98P, No. HKUST6152/01P, and No. CityU1238/02P.

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@article{037e6de290474c9b99725c4ad2a229a6,

title = "Layer Spacings in Coherently Strained Epitaxial Metal Films",

abstract = "Laterally resolved measurements of the quantum size effect (QSE) in electron reflectivity are made with low energy electron microscopy on coherently strained Ag films on a W(110) surface. The evolution of the total film thickness with increasing number of atomic layers is determined accurately by dynamical theory analysis of the QSE features. Combined with a model of layer spacings obtained from first-principles calculations, this provides for a novel approach to determine the buried interface layer spacing, which is inaccessible to other methods. {\textcopyright} 2003 The American Physical Society.",

author = "Chung, \{W. F.\} and Feng, \{Y. J.\} and Poon, \{H. C.\} and Chan, \{C. T.\} and Tong, \{S. Y.\} and Altman, \{M. S.\}",

note = "Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].",

year = "2003",

doi = "10.1103/PhysRevLett.90.216105",

language = "English",

volume = "90",

journal = "Physical Review Letters",

issn = "0031-9007",

publisher = "American Physical Society",

number = "21",

}

TY - JOUR

T1 - Layer Spacings in Coherently Strained Epitaxial Metal Films

AU - Chung, W. F.

AU - Feng, Y. J.

AU - Poon, H. C.

AU - Chan, C. T.

AU - Tong, S. Y.

AU - Altman, M. S.

N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

PY - 2003

Y1 - 2003

N2 - Laterally resolved measurements of the quantum size effect (QSE) in electron reflectivity are made with low energy electron microscopy on coherently strained Ag films on a W(110) surface. The evolution of the total film thickness with increasing number of atomic layers is determined accurately by dynamical theory analysis of the QSE features. Combined with a model of layer spacings obtained from first-principles calculations, this provides for a novel approach to determine the buried interface layer spacing, which is inaccessible to other methods. © 2003 The American Physical Society.

AB - Laterally resolved measurements of the quantum size effect (QSE) in electron reflectivity are made with low energy electron microscopy on coherently strained Ag films on a W(110) surface. The evolution of the total film thickness with increasing number of atomic layers is determined accurately by dynamical theory analysis of the QSE features. Combined with a model of layer spacings obtained from first-principles calculations, this provides for a novel approach to determine the buried interface layer spacing, which is inaccessible to other methods. © 2003 The American Physical Society.

UR - https://www.scopus.com/pages/publications/84892404176

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-84892404176&origin=recordpage

U2 - 10.1103/PhysRevLett.90.216105

DO - 10.1103/PhysRevLett.90.216105

M3 - RGC 21 - Publication in refereed journal

SN - 0031-9007

VL - 90

JO - Physical Review Letters

JF - Physical Review Letters

IS - 21

ER -

Layer Spacings in Coherently Strained Epitaxial Metal Films

Abstract

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