Latent label consistent K-SVD for joint machine faults representation and classification

Zhao Zhang*, Weiming Jiang, Lei Jia, Mingbo Zhao, Fanzhang Li

*Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

3 Citations (Scopus)

Abstract

We propose a new discriminative dictionary learning framework termed Latent Label Consistent K-SVD (LLC-KSVD) for representing and classifying machine faults. Our LLC-KSVD handles the task by minimizing the reconstruction, discriminative sparse-code and classification errors at the same time. To enhance the representation and classification powers, LLC-KSVD aim to decompose given data into a sparse reconstruction part, a salient feature part and an error part. The salient features are learnt by embedding data onto a projection and a classifier is then trained over extracted salient features so that features are ensured to be optimal for classification. Thus, the classification approach of our LLC-KSVD is very efficient, since there is no need to involve a time-consuming sparse reconstruction process with well-trained dictionary for each test signal as existing models. Besides, to make the classifier be robust to noise and outliers, we regularize the l2,¿-norm on classifier so that the predictions are more accurate. Simulations on several machine fault datasets demonstrate the state-of-the-art performance by our LLC-KSVD.
Original languageEnglish
Title of host publicationIEEE International Conference on Industrial Informatics (INDIN)
PublisherIEEE
Pages794-799
ISBN (Print)9781509028702
DOIs
Publication statusPublished - 13 Jan 2017
Event14th IEEE International Conference on Industrial Informatics (INDIN 2016) - Palais des congrès du Futuroscope, Poitiers, France
Duration: 19 Jul 201621 Jul 2016

Publication series

Name
ISSN (Print)1935-4576

Conference

Conference14th IEEE International Conference on Industrial Informatics (INDIN 2016)
PlaceFrance
CityPoitiers
Period19/07/1621/07/16

Research Keywords

  • feature extraction
  • label consistent dictionary learning
  • machine faults representation and classification
  • SPARSE REPRESENTATION
  • RECOGNITION
  • DIAGNOSIS

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